Crystal growth in Se70Te30 thin films followed by SEM and in situ XRD

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F16%3A39902151" target="_blank" >RIV/00216275:25310/16:39902151 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1063/1.4964425" target="_blank" >http://dx.doi.org/10.1063/1.4964425</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.4964425" target="_blank" >10.1063/1.4964425</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Crystal growth in Se70Te30 thin films followed by SEM and in situ XRD

Popis výsledku v původním jazyce

The isothermal crystal growth kinetics in Se70Te30 thin films was investigated using the microscopy and in situ X-ray diffraction (XRD) measurements. Plate-like crystals grew linearly with time which is the sign of liquid-crystal interface kinetics. In the studied temperature range, from 68 degrees C to 88 degrees C, crystal growth rates exhibit simple exponential behavior with an activation energy of crystal growth E-G = 168 +/- 12 kJ mol(-1). The growth data obtained from the microscopy measurements were combined with viscosity data, melting parameters and the appropriate crystal growth model was assessed. The relation between the kinetic coefficient of crystal growth and viscosity (u proportional to eta-(xi)) is described in detail, and a correction of the standard growth model is suggested. The crystal growth data obtained from the in situ XRD measurements were described using the Johnson-Mehl-Avrami nucleation-growth model with the Avrami exponent m = 2.2 +/- 0.2. The activation energy of the overall crystallization process EA was estimated and its value is 171 +/- 11 kJ mol(-1). Published by AIP Publishing.

Název v anglickém jazyce

Crystal growth in Se70Te30 thin films followed by SEM and in situ XRD

Popis výsledku anglicky

The isothermal crystal growth kinetics in Se70Te30 thin films was investigated using the microscopy and in situ X-ray diffraction (XRD) measurements. Plate-like crystals grew linearly with time which is the sign of liquid-crystal interface kinetics. In the studied temperature range, from 68 degrees C to 88 degrees C, crystal growth rates exhibit simple exponential behavior with an activation energy of crystal growth E-G = 168 +/- 12 kJ mol(-1). The growth data obtained from the microscopy measurements were combined with viscosity data, melting parameters and the appropriate crystal growth model was assessed. The relation between the kinetic coefficient of crystal growth and viscosity (u proportional to eta-(xi)) is described in detail, and a correction of the standard growth model is suggested. The crystal growth data obtained from the in situ XRD measurements were described using the Johnson-Mehl-Avrami nucleation-growth model with the Avrami exponent m = 2.2 +/- 0.2. The activation energy of the overall crystallization process EA was estimated and its value is 171 +/- 11 kJ mol(-1). Published by AIP Publishing.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

CF - Fyzikální chemie a teoretická chemie

OECD FORD obor

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Projekt

<a href="/cs/project/GA16-10562S" target="_blank" >GA16-10562S: Viskozita a kinetické jevy ve sklotvorných systémech</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Applied Physics

ISSN

0021-8979

e-ISSN

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Svazek periodika

120

Číslo periodika v rámci svazku

14

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

7

Strana od-do

"145301-1"-"145301-7"

Kód UT WoS článku

000386535400063

EID výsledku v databázi Scopus

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