Spectroscopic ellipsometry investigation of electronic states and optical properties of thin films from Ge30AsxSe70-x system.

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F20%3A39917187" target="_blank" >RIV/00216275:25310/20:39917187 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.sciencedirect.com/science/article/pii/S0022309320301654?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0022309320301654?via%3Dihub</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.jnoncrysol.2020.120048" target="_blank" >10.1016/j.jnoncrysol.2020.120048</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Spectroscopic ellipsometry investigation of electronic states and optical properties of thin films from Ge30AsxSe70-x system.

Popis výsledku v původním jazyce

This paper deals with the investigation of the optical properties of thin films from the Ge30AsxSe70-x system. The complex permittivity, (epsilon) over cap = epsilon(1) + i epsilon(2), and the optical band gap, E-g(opt) were determined by spectroscopic ellipsometry measurements. The spectra of epsilon 2 in the ultraviolet spectral range were analysed on the base of the existing literature data for the valence band spectra obtained by X-ray photoelectron spectroscopy. It was found that the absorption in the spectral range 2.0-6.5 eV is related to the bonding and anti-bondingp-orbitals of Ge, Se and As atoms. The temperature coefficients of linear expansion, refractive index and the band gaps were determined. The evaluated values for the non-linear refractive index, gamma, and the two-photon absorption coefficient, beta, showed that the thin films exhibit a highly non-linear refractive index at the telecommunication wavelength.

Název v anglickém jazyce

Spectroscopic ellipsometry investigation of electronic states and optical properties of thin films from Ge30AsxSe70-x system.

Popis výsledku anglicky

This paper deals with the investigation of the optical properties of thin films from the Ge30AsxSe70-x system. The complex permittivity, (epsilon) over cap = epsilon(1) + i epsilon(2), and the optical band gap, E-g(opt) were determined by spectroscopic ellipsometry measurements. The spectra of epsilon 2 in the ultraviolet spectral range were analysed on the base of the existing literature data for the valence band spectra obtained by X-ray photoelectron spectroscopy. It was found that the absorption in the spectral range 2.0-6.5 eV is related to the bonding and anti-bondingp-orbitals of Ge, Se and As atoms. The temperature coefficients of linear expansion, refractive index and the band gaps were determined. The evaluated values for the non-linear refractive index, gamma, and the two-photon absorption coefficient, beta, showed that the thin films exhibit a highly non-linear refractive index at the telecommunication wavelength.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10402 - Inorganic and nuclear chemistry

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Non-Crystalline Solids

ISSN

0022-3093

e-ISSN

—

Svazek periodika

538

Číslo periodika v rámci svazku

120048

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

9

Strana od-do

1-9

Kód UT WoS článku

000527030200011

EID výsledku v databázi Scopus

2-s2.0-85082009213