Native Crystal Growth Revealed by a Joint Microscopy-Calorimetry Technique in (GeS2)0.1(Sb2S3)0.9 Thin Amorphous Films: A Critical Role of Internal Stress and Mechanical Defects

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F24%3A39922019" target="_blank" >RIV/00216275:25310/24:39922019 - isvavai.cz</a>

Výsledek na webu

<a href="https://pubs.acs.org/doi/10.1021/acs.cgd.3c01356" target="_blank" >https://pubs.acs.org/doi/10.1021/acs.cgd.3c01356</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1021/acs.cgd.3c01356" target="_blank" >10.1021/acs.cgd.3c01356</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Native Crystal Growth Revealed by a Joint Microscopy-Calorimetry Technique in (GeS2)0.1(Sb2S3)0.9 Thin Amorphous Films: A Critical Role of Internal Stress and Mechanical Defects

Popis výsledku v původním jazyce

A novel joint microscopy-calorimetry technique pioneered in the present thin film research was used to investigate the influence of the substrate type on the crystal growth in (GeS2)(0.1)(Sb2S3)(0.9) thin films crystallizing from the free surface. The explored temperature ranges were 205-285 and 210-350 degrees C for microscopy and calorimetry, respectively. Identical temperature dependences of the macroscopic and microscopic crystal growth rates, crystal growth activation energies (decreasing from 333 to 277 kJ&lt;middle dot&gt;mol(-1)), and values of the Ediger&apos;s decoupling parameter (decreasing from 0.63 to 0.55) were obtained for as-deposited thin films on Kapton as well as white glass substrates, confirming the negligible influence of the substrate nature. However, both types of as-deposited films exhibited markedly accelerated crystal growth compared to the powdered thin film (scraped-off of the substrate), for which the formation rate of the crystalline phase was practically identical to the native behavior of bulk glass. This unambiguously confirms the marked influence of the crystal-growth-accelerating internal stresses being built up during the heating of the thin film firmly attached to the substrate, where each of the two materials has a different thermal expansion coefficient. The unmatched accuracy and resolution of the joint microscopy-calorimetry approach were demonstrated, with similar subtle intrinsic trends in the crystal growth behavior being recognized by both techniques. Future prospects of the simultaneous in situ polarization microscopy measurements of crystal growth in the as-deposited thin films were introduced and discussed.

Název v anglickém jazyce

Native Crystal Growth Revealed by a Joint Microscopy-Calorimetry Technique in (GeS2)0.1(Sb2S3)0.9 Thin Amorphous Films: A Critical Role of Internal Stress and Mechanical Defects

Popis výsledku anglicky

A novel joint microscopy-calorimetry technique pioneered in the present thin film research was used to investigate the influence of the substrate type on the crystal growth in (GeS2)(0.1)(Sb2S3)(0.9) thin films crystallizing from the free surface. The explored temperature ranges were 205-285 and 210-350 degrees C for microscopy and calorimetry, respectively. Identical temperature dependences of the macroscopic and microscopic crystal growth rates, crystal growth activation energies (decreasing from 333 to 277 kJ&lt;middle dot&gt;mol(-1)), and values of the Ediger&apos;s decoupling parameter (decreasing from 0.63 to 0.55) were obtained for as-deposited thin films on Kapton as well as white glass substrates, confirming the negligible influence of the substrate nature. However, both types of as-deposited films exhibited markedly accelerated crystal growth compared to the powdered thin film (scraped-off of the substrate), for which the formation rate of the crystalline phase was practically identical to the native behavior of bulk glass. This unambiguously confirms the marked influence of the crystal-growth-accelerating internal stresses being built up during the heating of the thin film firmly attached to the substrate, where each of the two materials has a different thermal expansion coefficient. The unmatched accuracy and resolution of the joint microscopy-calorimetry approach were demonstrated, with similar subtle intrinsic trends in the crystal growth behavior being recognized by both techniques. Future prospects of the simultaneous in situ polarization microscopy measurements of crystal growth in the as-deposited thin films were introduced and discussed.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20506 - Coating and films

Projekt

<a href="/cs/project/GA23-07574S" target="_blank" >GA23-07574S: Optické vlastnosti amorfních, tepelně a laserem krystalizovaných materiálů na bázi chalkogenidů a jejich optimalizace pro fázově řízenou nanofotoniku</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Crystal Growth and Design

ISSN

1528-7483

e-ISSN

1528-7505

Svazek periodika

24

Číslo periodika v rámci svazku

4

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

13

Strana od-do

1724-1736

Kód UT WoS článku

001166565200001

EID výsledku v databázi Scopus

2-s2.0-85185589840