Fast impedance spectroscopy method for insulating layers with very high impedance

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26110%2F09%3APU85378" target="_blank" >RIV/00216305:26110/09:PU85378 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Fast impedance spectroscopy method for insulating layers with very high impedance

Popis výsledku v původním jazyce

The paper presents a fast impedance spectroscopy method for objects with very high impedance |Zx| ? 1G? modeled by RC networks. The method is suitable for predicting lifetime and reliability of insulating materials. Fast impedance spectroscopy method wastested on the insulating layers, which were part of the system metal-insulator-metal (MIM). Method is based on measurements of the power loss and phase shift in the AC voltage divider, which consists of measured system MIM and of the known impedance. Computer controlled instruments measure the gain and phase shift between the two outputs of alternating electrical circuit and computer program calculates parameters of impedance spectroscopy from this values. The outputs are the graphical and tabular impedance characteristics of the MIM system, namely: the dielectric loss of the insulating film, imaginary part of impedance, loss factor, parallel resistance Rp and capacity Cp of MIM system, all frequency dependent. Frequency characteristic

Název v anglickém jazyce

Fast impedance spectroscopy method for insulating layers with very high impedance

Popis výsledku anglicky

The paper presents a fast impedance spectroscopy method for objects with very high impedance |Zx| ? 1G? modeled by RC networks. The method is suitable for predicting lifetime and reliability of insulating materials. Fast impedance spectroscopy method wastested on the insulating layers, which were part of the system metal-insulator-metal (MIM). Method is based on measurements of the power loss and phase shift in the AC voltage divider, which consists of measured system MIM and of the known impedance. Computer controlled instruments measure the gain and phase shift between the two outputs of alternating electrical circuit and computer program calculates parameters of impedance spectroscopy from this values. The outputs are the graphical and tabular impedance characteristics of the MIM system, namely: the dielectric loss of the insulating film, imaginary part of impedance, loss factor, parallel resistance Rp and capacity Cp of MIM system, all frequency dependent. Frequency characteristic

Druh

D - Stať ve sborníku

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2009

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

7th workshop NDT 2009, non-destructive testing in engineering practice

ISBN

978-80-7204-671-3

ISSN

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e-ISSN

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Počet stran výsledku

8

Strana od-do

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Název nakladatele

CERM

Místo vydání

Brno

Místo konání akce

Brno

Datum konání akce

25. 11. 2009

Typ akce podle státní příslušnosti

EUR - Evropská akce

Kód UT WoS článku

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