Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F17%3APU123567" target="_blank" >RIV/00216305:26210/17:PU123567 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-25-14-16560&id=369005" target="_blank" >https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-25-14-16560&id=369005</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/OE.25.016560" target="_blank" >10.1364/OE.25.016560</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state

Popis výsledku v původním jazyce

Scanning near-field optical microscopy (SNOM) in combination with interference structures is a powerful tool for imaging and analysis of surface plasmon polaritons (SPPs). However, the correct interpretation of SNOM images requires profound understanding of principles behind their formation. To study fundamental principles of SNOM imaging in detail, we performed spectroscopic measurements by an aperture-type SNOM setup equipped with a supercontinuum laser and a polarizer, which gave us all the degrees of freedom necessary for our investigation. The series of wavelength- and polarization-resolved measurements, together with results of numerical simulations, then allowed us to identify the role of individual near-field components in formation of SNOM images, and to show that the out-of-plane component generally dominates within a broad range of parameters explored in our study. Our results challenge the widespread notion that this component does not couple to the a-SNOM probe and indicate that the issue of SNOM probe sensitivity towards the in-plane and out-of-plane near-field components – one of the most challenging tasks of near field interference SNOM measurements – is not yet fully resolved.

Název v anglickém jazyce

Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state

Popis výsledku anglicky

Scanning near-field optical microscopy (SNOM) in combination with interference structures is a powerful tool for imaging and analysis of surface plasmon polaritons (SPPs). However, the correct interpretation of SNOM images requires profound understanding of principles behind their formation. To study fundamental principles of SNOM imaging in detail, we performed spectroscopic measurements by an aperture-type SNOM setup equipped with a supercontinuum laser and a polarizer, which gave us all the degrees of freedom necessary for our investigation. The series of wavelength- and polarization-resolved measurements, together with results of numerical simulations, then allowed us to identify the role of individual near-field components in formation of SNOM images, and to show that the out-of-plane component generally dominates within a broad range of parameters explored in our study. Our results challenge the widespread notion that this component does not couple to the a-SNOM probe and indicate that the issue of SNOM probe sensitivity towards the in-plane and out-of-plane near-field components – one of the most challenging tasks of near field interference SNOM measurements – is not yet fully resolved.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

OPTICS EXPRESS

ISSN

1094-4087

e-ISSN

—

Svazek periodika

25

Číslo periodika v rámci svazku

14

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

13

Strana od-do

16560-16573

Kód UT WoS článku

000407815100085

EID výsledku v databázi Scopus

2-s2.0-85022075647