Film Thickness in Elastohydrodynamically Lubricated Slender Elliptic Contacts: Part II - Experimental Validation and Minimum Film Thickness

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F22%3APU145911" target="_blank" >RIV/00216305:26210/22:PU145911 - isvavai.cz</a>

Výsledek na webu

<a href="https://journals.sagepub.com/doi/10.1177/13506501221080289" target="_blank" >https://journals.sagepub.com/doi/10.1177/13506501221080289</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1177/13506501221080289" target="_blank" >10.1177/13506501221080289</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Film Thickness in Elastohydrodynamically Lubricated Slender Elliptic Contacts: Part II - Experimental Validation and Minimum Film Thickness

Popis výsledku v původním jazyce

In the first paper of this series, a new formula for central film thickness of slender contacts has been proposed. In this paper, interferometry measurement of the film thickness in slender elliptic contacts is performed for comparison with film thickness distribution of EHL simulation. The new film thickness formula presented in part I of this paper series is successfully validated by comparison with the experimental data. State-of-the-art minimum film thickness formulas are compared with the experimental results and results obtained through a multilevel EHL solver. Significant deviation of the analytical minimum film thickness formulas regarding both numerical and experimental results is given. Therefore, an alternative approach for calculation of minimum film thickness via the film thickness ratio with central film thickness is proposed, which yields promising results for moderately slender elliptic EHL contacts.

Název v anglickém jazyce

Film Thickness in Elastohydrodynamically Lubricated Slender Elliptic Contacts: Part II - Experimental Validation and Minimum Film Thickness

Popis výsledku anglicky

In the first paper of this series, a new formula for central film thickness of slender contacts has been proposed. In this paper, interferometry measurement of the film thickness in slender elliptic contacts is performed for comparison with film thickness distribution of EHL simulation. The new film thickness formula presented in part I of this paper series is successfully validated by comparison with the experimental data. State-of-the-art minimum film thickness formulas are compared with the experimental results and results obtained through a multilevel EHL solver. Significant deviation of the analytical minimum film thickness formulas regarding both numerical and experimental results is given. Therefore, an alternative approach for calculation of minimum film thickness via the film thickness ratio with central film thickness is proposed, which yields promising results for moderately slender elliptic EHL contacts.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20301 - Mechanical engineering

Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2022

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART J-JOURNAL OF ENGINEERING TRIBOLOGY

ISSN

1350-6501

e-ISSN

2041-305X

Svazek periodika

236

Číslo periodika v rámci svazku

12

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

14

Strana od-do

2477-2490

Kód UT WoS článku

000769463800001

EID výsledku v databázi Scopus

2-s2.0-85126122384