New Approach in Wide Range Conductivity Measurement with Planar Sensor

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU29932" target="_blank" >RIV/00216305:26220/02:PU29932 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

New Approach in Wide Range Conductivity Measurement with Planar Sensor

Popis výsledku v původním jazyce

This paper contributes to the field of precise electrolytic conductivity measurements with planar sensors. This novel measuring method was suggested for measurement with comb-like thick-film electrodes. Correction characteristics over a wide range of a specific conductivities were determined from an interface impedance characterisation of the thick-film electrodes. The cell constant strongly depends on the frequency and conductivity of solutions. A local minimum of the imaginary part of the interface iimpedance is used for corrections to get linear responses. In this minimum a ridge frequency and cell constant were determined for each measured conductivity. An iteration mode of measurements was suggested to exactly measure the conductivity in the ridgefrequency in order to achieve a highly accurate response. An implementation of this method as a microcontroller application can used to build-up microsystems for precise conductivity measurements in concentration ranges from 10-6 to 1 M

Název v anglickém jazyce

New Approach in Wide Range Conductivity Measurement with Planar Sensor

Popis výsledku anglicky

This paper contributes to the field of precise electrolytic conductivity measurements with planar sensors. This novel measuring method was suggested for measurement with comb-like thick-film electrodes. Correction characteristics over a wide range of a specific conductivities were determined from an interface impedance characterisation of the thick-film electrodes. The cell constant strongly depends on the frequency and conductivity of solutions. A local minimum of the imaginary part of the interface iimpedance is used for corrections to get linear responses. In this minimum a ridge frequency and cell constant were determined for each measured conductivity. An iteration mode of measurements was suggested to exactly measure the conductivity in the ridgefrequency in order to achieve a highly accurate response. An implementation of this method as a microcontroller application can used to build-up microsystems for precise conductivity measurements in concentration ranges from 10-6 to 1 M

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GA102%2F00%2F0939" target="_blank" >GA102/00/0939: Integrované inteligentní mikrosenzory a mikrosystémy</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2002

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Socrates Workshop 2002 - Proceedings. Intensive Training Programme in Electronic System Design. Chania, Crete (Greece)

ISBN

80-214-2217-3

ISSN

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e-ISSN

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Počet stran výsledku

4

Strana od-do

112-115

Název nakladatele

FEKT VUT v Brně

Místo vydání

Ing. Z. Novotny, Brno

Místo konání akce

Chania, Crete

Datum konání akce

2. 9. 2002

Typ akce podle státní příslušnosti

EUR - Evropská akce

Kód UT WoS článku

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