Wide Range Precise Conductivity Measurement without Cell Replacement

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU29928" target="_blank" >RIV/00216305:26220/02:PU29928 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

Wide Range Precise Conductivity Measurement without Cell Replacement

Popis výsledku v původním jazyce

This paper a little contributes into precise electrolytic conductivity measurements with planar sensors. The novel measuring method was suggested for measurement with IDEs thick-film electrodes. Correction characteristics in wide range of a specific conductivity were determined from a interface impedance characterisation of the thick-film IDEs. The cell constant strongly depends on frequency and conductivity of solutions. A local minimum of the imaginary part of the interface impedance is used for correections to get linear responses. In this minimum a ridge frequency and a cell constant were determined for each measured conductivity. An iteration mode of measurements was suggested to measure exactly in the ridge frequency of the measured conductivityto rich high accurate response. A implementation of the method as microcontroller application can used to built-up microsystem for precise conductivity measurements in concentration range from 10-6 to 1 M without the cell replacement.

Název v anglickém jazyce

Wide Range Precise Conductivity Measurement without Cell Replacement

Popis výsledku anglicky

This paper a little contributes into precise electrolytic conductivity measurements with planar sensors. The novel measuring method was suggested for measurement with IDEs thick-film electrodes. Correction characteristics in wide range of a specific conductivity were determined from a interface impedance characterisation of the thick-film IDEs. The cell constant strongly depends on frequency and conductivity of solutions. A local minimum of the imaginary part of the interface impedance is used for correections to get linear responses. In this minimum a ridge frequency and a cell constant were determined for each measured conductivity. An iteration mode of measurements was suggested to measure exactly in the ridge frequency of the measured conductivityto rich high accurate response. A implementation of the method as microcontroller application can used to built-up microsystem for precise conductivity measurements in concentration range from 10-6 to 1 M without the cell replacement.

Druh

D - Stať ve sborníku

CEP obor

JB - Senzory, čidla, měření a regulace

OECD FORD obor

—

Projekt

<a href="/cs/project/GA102%2F00%2F0939" target="_blank" >GA102/00/0939: Integrované inteligentní mikrosenzory a mikrosystémy</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2002

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of Conference Eurosensors XVI

ISBN

—

ISSN

—

e-ISSN

—

Počet stran výsledku

4

Strana od-do

1-4

Název nakladatele

Czech Technical University, Prague

Místo vydání

Praha

Místo konání akce

Praha

Datum konání akce

15. 9. 2002

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

—