Model nosníku v mikroskopii atomových sil

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F04%3APU44747" target="_blank" >RIV/00216305:26220/04:PU44747 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Model of the cantilever used in Atomic Force Microscopy

Popis výsledku v původním jazyce

New types of weak forces measurements with Atomic Force Microscope (AFM) are very challenging for experimental physics and call for new studies on control strategies operating the AFM. It is thus necessary to first develop a precise model of the cantilever with its sharp tip, in interaction with the scanned sample. This paper presents a model of the cantilever, that is based on beam theory and taking into account the influence of the long distance interaction forces. Developed multi mode cantilever mmodel is capable to describe the behaviour of the real measuring system with good precision. Model is taking into a consideration the influence of higher harmonics and their share on the total tip displacement of the cantilever. Simulated frequency spectrais fully fitting to theoretical expectation and has been successfully confronted with measured data on the real system with a cantilever of same dimensions and properties. For a better understanding of the interaction and its impact on ca

Název v anglickém jazyce

Model of the cantilever used in Atomic Force Microscopy

Popis výsledku anglicky

New types of weak forces measurements with Atomic Force Microscope (AFM) are very challenging for experimental physics and call for new studies on control strategies operating the AFM. It is thus necessary to first develop a precise model of the cantilever with its sharp tip, in interaction with the scanned sample. This paper presents a model of the cantilever, that is based on beam theory and taking into account the influence of the long distance interaction forces. Developed multi mode cantilever mmodel is capable to describe the behaviour of the real measuring system with good precision. Model is taking into a consideration the influence of higher harmonics and their share on the total tip displacement of the cantilever. Simulated frequency spectrais fully fitting to theoretical expectation and has been successfully confronted with measured data on the real system with a cantilever of same dimensions and properties. For a better understanding of the interaction and its impact on ca

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GD102%2F03%2FH116" target="_blank" >GD102/03/H116: TALENT - koordinovaná výchova studentů doktorských studijních programů v oblasti řídicí techniky a robotiky</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2004

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Journées Nanosciences Nanotechnologies en Rhône-Alpes 2004

ISBN

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ISSN

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e-ISSN

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Počet stran výsledku

1

Strana od-do

82-82

Název nakladatele

CNRS, CEA

Místo vydání

Grenoble

Místo konání akce

Grenoble

Datum konání akce

18. 11. 2004

Typ akce podle státní příslušnosti

CST - Celostátní akce

Kód UT WoS článku

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