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Transport náboje v tlustých vrstvách na bázi polymerů

Popis výsledku

We proposed the model for the charge carrier transport in the polymer based thick film structures. The model is based on the assumption that the electric charge transport is due to the electron tunnelling through the barrier between carbon and graphite particles. The main noise and non-linearity sources in polymer based thick film layer are considered to be the contacts between conducting grains. On the basis of this model the sheet resistance and effective number of electrons acting as mobility fluctuaators in one point contact can be calculated. From the low frequency noise measurements we can estimate the number of point contacts in the thick film resistive layer. The influence of the polymer vehicle and thermal treatment on the thick film structureis characterized by noise and nonlinearity measurements. During the thermal treatment the conductivity of the resistive layer is changed due to the change of number of contacts between conducting grains - the distance between conducting g

Klíčová slova

NoiseNon-linearityThick filmPolymer based TFR

Identifikátory výsledku

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Charge Carrier Transport in Polymer-Based Thick Resistive Films

  • Popis výsledku v původním jazyce

    We proposed the model for the charge carrier transport in the polymer based thick film structures. The model is based on the assumption that the electric charge transport is due to the electron tunnelling through the barrier between carbon and graphite particles. The main noise and non-linearity sources in polymer based thick film layer are considered to be the contacts between conducting grains. On the basis of this model the sheet resistance and effective number of electrons acting as mobility fluctuaators in one point contact can be calculated. From the low frequency noise measurements we can estimate the number of point contacts in the thick film resistive layer. The influence of the polymer vehicle and thermal treatment on the thick film structureis characterized by noise and nonlinearity measurements. During the thermal treatment the conductivity of the resistive layer is changed due to the change of number of contacts between conducting grains - the distance between conducting g

  • Název v anglickém jazyce

    Charge Carrier Transport in Polymer-Based Thick Resistive Films

  • Popis výsledku anglicky

    We proposed the model for the charge carrier transport in the polymer based thick film structures. The model is based on the assumption that the electric charge transport is due to the electron tunnelling through the barrier between carbon and graphite particles. The main noise and non-linearity sources in polymer based thick film layer are considered to be the contacts between conducting grains. On the basis of this model the sheet resistance and effective number of electrons acting as mobility fluctuaators in one point contact can be calculated. From the low frequency noise measurements we can estimate the number of point contacts in the thick film resistive layer. The influence of the polymer vehicle and thermal treatment on the thick film structureis characterized by noise and nonlinearity measurements. During the thermal treatment the conductivity of the resistive layer is changed due to the change of number of contacts between conducting grains - the distance between conducting g

Klasifikace

  • Druh

    Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

  • CEP obor

    JA - Elektronika a optoelektronika, elektrotechnika

  • OECD FORD obor

Návaznosti výsledku

  • Projekt

  • Návaznosti

    Z - Vyzkumny zamer (s odkazem do CEZ)

Ostatní

  • Rok uplatnění

    2005

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název periodika

    Capacitor and Resistor Technology

  • ISSN

    0887-7491

  • e-ISSN

  • Svazek periodika

    2005

  • Číslo periodika v rámci svazku

    10

  • Stát vydavatele periodika

    US - Spojené státy americké

  • Počet stran výsledku

    6

  • Strana od-do

    93-98

  • Kód UT WoS článku

  • EID výsledku v databázi Scopus

Základní informace

Druh výsledku

Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

Jx

CEP

JA - Elektronika a optoelektronika, elektrotechnika

Rok uplatnění

2005