Transport náboje v tlustých vrstvách na bázi polymerů

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU52121" target="_blank" >RIV/00216305:26220/05:PU52121 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Charge Carrier Transport in Polymer-Based Thick Resistive Films

Popis výsledku v původním jazyce

We proposed the model for the charge carrier transport in the polymer based thick film structures. The model is based on the assumption that the electric charge transport is due to the electron tunnelling through the barrier between carbon and graphite particles. The main noise and non-linearity sources in polymer based thick film layer are considered to be the contacts between conducting grains. On the basis of this model the sheet resistance and effective number of electrons acting as mobility fluctuaators in one point contact can be calculated. From the low frequency noise measurements we can estimate the number of point contacts in the thick film resistive layer. The influence of the polymer vehicle and thermal treatment on the thick film structureis characterized by noise and nonlinearity measurements. During the thermal treatment the conductivity of the resistive layer is changed due to the change of number of contacts between conducting grains - the distance between conducting g

Název v anglickém jazyce

Charge Carrier Transport in Polymer-Based Thick Resistive Films

Popis výsledku anglicky

We proposed the model for the charge carrier transport in the polymer based thick film structures. The model is based on the assumption that the electric charge transport is due to the electron tunnelling through the barrier between carbon and graphite particles. The main noise and non-linearity sources in polymer based thick film layer are considered to be the contacts between conducting grains. On the basis of this model the sheet resistance and effective number of electrons acting as mobility fluctuaators in one point contact can be calculated. From the low frequency noise measurements we can estimate the number of point contacts in the thick film resistive layer. The influence of the polymer vehicle and thermal treatment on the thick film structureis characterized by noise and nonlinearity measurements. During the thermal treatment the conductivity of the resistive layer is changed due to the change of number of contacts between conducting grains - the distance between conducting g

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2005

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Capacitor and Resistor Technology

ISSN

0887-7491

e-ISSN

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Svazek periodika

2005

Číslo periodika v rámci svazku

10

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

6

Strana od-do

93-98

Kód UT WoS článku

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EID výsledku v databázi Scopus

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