Nízkofrekvenční šum v krystalech CdTe

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU52498" target="_blank" >RIV/00216305:26220/05:PU52498 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216208:11320/05:00000995

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Low Frequency Noise of the CdTe Crystals

Popis výsledku v původním jazyce

Experimental studies of transport and noise characteristics of CdTe bulk single crystals have been carried out. The noise measurement was used to characterized the quality of sample surface and contact technology. As a quality indicator we have choose the 1/f noise. In this case the 1/f noise is generated in sample volume, on surface and contacts. The main problem to be solved was the separation of these noise sources. The noise spectral density was measured by four probe method to separate contact noisse from the other sources. To distinguish between 1/f noise generated in sample volume and on the surface the noise measurement was performed as a function of incident light wavelengths for constant electric field and current was varied both by the sample illumination and photon energy change. There are three different 1/f noise sources: (i)bulk 1/f noise generated by sub band gap energy photons with current noise spectral density proportional to first power of current, (ii)surface 1/f n

Název v anglickém jazyce

Low Frequency Noise of the CdTe Crystals

Popis výsledku anglicky

Experimental studies of transport and noise characteristics of CdTe bulk single crystals have been carried out. The noise measurement was used to characterized the quality of sample surface and contact technology. As a quality indicator we have choose the 1/f noise. In this case the 1/f noise is generated in sample volume, on surface and contacts. The main problem to be solved was the separation of these noise sources. The noise spectral density was measured by four probe method to separate contact noisse from the other sources. To distinguish between 1/f noise generated in sample volume and on the surface the noise measurement was performed as a function of incident light wavelengths for constant electric field and current was varied both by the sample illumination and photon energy change. There are three different 1/f noise sources: (i)bulk 1/f noise generated by sub band gap energy photons with current noise spectral density proportional to first power of current, (ii)surface 1/f n

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2005

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Noise and Fluctuations

ISBN

0-7354-0267-1

ISSN

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e-ISSN

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Počet stran výsledku

4

Strana od-do

175-178

Název nakladatele

American Institute of Physics

Místo vydání

Salamanca, Spain

Místo konání akce

Salamanca, Spain

Datum konání akce

19. 9. 2005

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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