Rentgenová mikroanalýza v ESEM

Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F06%3APU64539" target="_blank" >RIV/00216305:26220/06:PU64539 - isvavai.cz</a>
Výsledek na webu
—
DOI - Digital Object Identifier
—

Jazyk výsledku
angličtina
Název v původním jazyce
X - RAY MICROANALYSIS IN ESEM
Popis výsledku v původním jazyce
The X-ray microanalysis performed in ESEM requires to take into account presence of gas in the specimen chamber. The impact of electron scattering causes disadvantageous general increase of concentration limits of executed analysis by additional X-ray peaks contributed by the so called skirt. At X-ray analysis scattered skirt electrons interact with atoms of specimen and produce X-rays but we do not know which X-rays are produced by primary beam and which are produced by skirt electrons. Pressure variation method is described. This method enables extrapolation of X- ray spectral measurements at higher pressures to zero pressure.
Název v anglickém jazyce
X - RAY MICROANALYSIS IN ESEM
Popis výsledku anglicky
The X-ray microanalysis performed in ESEM requires to take into account presence of gas in the specimen chamber. The impact of electron scattering causes disadvantageous general increase of concentration limits of executed analysis by additional X-ray peaks contributed by the so called skirt. At X-ray analysis scattered skirt electrons interact with atoms of specimen and produce X-rays but we do not know which X-rays are produced by primary beam and which are produced by skirt electrons. Pressure variation method is described. This method enables extrapolation of X- ray spectral measurements at higher pressures to zero pressure.

Rok uplatnění
2006
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Podobné výsledky(10)