Rychlé rastrování

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F06%3APU65166" target="_blank" >RIV/00216305:26220/06:PU65166 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Fast LBIC Scanning of Solar Cells

Popis výsledku v původním jazyce

For detection of local defects in solar cells LBIC (Light Beam Induced Current) is a widely used universal method. The resulting picture indicates differences in local series and shunt resistances and differences in local rate of minority carriers recombination. A laser beam scanning over the solar cell surface is routinely used in this test. This process may take several hours depending on demanded picture resolution. A method for fast scanning of solar cells based on the LBIC measurement was proposedand tested. Instead of laser beam a linear light source consistent of multiple SMD LED diodes is used. Scanning is performed in both X and Y axes. In principle one scan in each coordinate is sufficient. The resulting current response is influenced by alldefects allocated in the actual position of the actuating light beam line. The picture of the solar cell defects is computed combining the contributions from each line in both X and Y axes. Result of this computation is not the same as t

Název v anglickém jazyce

Fast LBIC Scanning of Solar Cells

Popis výsledku anglicky

For detection of local defects in solar cells LBIC (Light Beam Induced Current) is a widely used universal method. The resulting picture indicates differences in local series and shunt resistances and differences in local rate of minority carriers recombination. A laser beam scanning over the solar cell surface is routinely used in this test. This process may take several hours depending on demanded picture resolution. A method for fast scanning of solar cells based on the LBIC measurement was proposedand tested. Instead of laser beam a linear light source consistent of multiple SMD LED diodes is used. Scanning is performed in both X and Y axes. In principle one scan in each coordinate is sufficient. The resulting current response is influenced by alldefects allocated in the actual position of the actuating light beam line. The picture of the solar cell defects is computed combining the contributions from each line in both X and Y axes. Result of this computation is not the same as t

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2006

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Electronic Devices and Systems EDS 06

ISBN

80-214-3246-2

ISSN

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e-ISSN

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Počet stran výsledku

4

Strana od-do

539-542

Název nakladatele

Nakl. Z. Novotný

Místo vydání

Brno

Místo konání akce

Brno

Datum konání akce

14. 9. 2006

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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