Elektro-ultrazvuková spektroskopie tlustých vrstev na bázi polymeru

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU74828" target="_blank" >RIV/00216305:26220/08:PU74828 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Electro-ultrasonic spectroscopy of polymer-based thick film layers

Popis výsledku v původním jazyce

We have studied the properties of polymer-based thick film layers by electro-ultrasonic spectroscopy. Electro-ultrasonic spectroscopy method is based on the interaction between ultrasonic vibrations and electrical conductivity of solids. The ultrasonic vibrations of frequency fU change the contact area between conducting grains in the thick film structure and then the resistance is modulated by the frequency of ultrasonic excitation. An intermodulation voltage is created on this structure. It depends onthe value of AC current varying with frequency fE and on the ultrasonic excited resistance change dR varying with frequency fU. We have measured the intermodulation voltage Um for a set of polymer-based thick film resistors made by different resistive pastes. It was found that for given sample the intermodulation component of frequency fm = fE - fU increases linearly with electric excitation for the constant ultrasonic excitation. We have normalized the intermodulation voltage Um by the

Název v anglickém jazyce

Electro-ultrasonic spectroscopy of polymer-based thick film layers

Popis výsledku anglicky

We have studied the properties of polymer-based thick film layers by electro-ultrasonic spectroscopy. Electro-ultrasonic spectroscopy method is based on the interaction between ultrasonic vibrations and electrical conductivity of solids. The ultrasonic vibrations of frequency fU change the contact area between conducting grains in the thick film structure and then the resistance is modulated by the frequency of ultrasonic excitation. An intermodulation voltage is created on this structure. It depends onthe value of AC current varying with frequency fE and on the ultrasonic excited resistance change dR varying with frequency fU. We have measured the intermodulation voltage Um for a set of polymer-based thick film resistors made by different resistive pastes. It was found that for given sample the intermodulation component of frequency fm = fE - fU increases linearly with electric excitation for the constant ultrasonic excitation. We have normalized the intermodulation voltage Um by the

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Microelectronics Reliability

ISSN

0026-2714

e-ISSN

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Svazek periodika

48

Číslo periodika v rámci svazku

6

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

4

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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