Noise, Non-Linearity and Electro-Ultrasonic Spectroscopy for Testing of Resistors

Kód výsledku v IS VaVaI

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Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Noise, Non-Linearity and Electro-Ultrasonic Spectroscopy for Testing of Resistors

Popis výsledku v původním jazyce

The quality and reliability of polymer based and cermet thick film layers were tested both by standard testing methods based on the measurements of the low frequency noise spectra, non-linearity and new proposed method: Electro-Ultrasonic Spectroscopy. The samples were made using different resistive and conducting pastes, both laboratory and commercially produced. The results of standard measuring methods are compared with those of the electro-ultrasonic spectroscopy. This method is based on the phononinteraction with conducting electrons and on the change of the contact area among the conducting particles. The ultrasonic signal changes the contact area between the conducting grains in the resistor structure and then the resistance is modulated by thefrequency of ultrasonic excitation. Resultant intermodulation voltage appearing on the sample depends on the value of AC current varying with frequency fE and on the ultrasonic excited resistance change ?R varying with frequency fU. Ultr

Název v anglickém jazyce

Noise, Non-Linearity and Electro-Ultrasonic Spectroscopy for Testing of Resistors

Popis výsledku anglicky

The quality and reliability of polymer based and cermet thick film layers were tested both by standard testing methods based on the measurements of the low frequency noise spectra, non-linearity and new proposed method: Electro-Ultrasonic Spectroscopy. The samples were made using different resistive and conducting pastes, both laboratory and commercially produced. The results of standard measuring methods are compared with those of the electro-ultrasonic spectroscopy. This method is based on the phononinteraction with conducting electrons and on the change of the contact area among the conducting particles. The ultrasonic signal changes the contact area between the conducting grains in the resistor structure and then the resistance is modulated by thefrequency of ultrasonic excitation. Resultant intermodulation voltage appearing on the sample depends on the value of AC current varying with frequency fE and on the ultrasonic excited resistance change ?R varying with frequency fU. Ultr

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

CARTS EUROPE 2008

ISBN

0-7908-0121-3

ISSN

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e-ISSN

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Počet stran výsledku

10

Strana od-do

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Název nakladatele

Neuveden

Místo vydání

Neuveden

Místo konání akce

Helsinky

Datum konání akce

20. 10. 2008

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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