Reliability of Electronic Devices: Failure Mechanisms and Testing

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU81969" target="_blank" >RIV/00216305:26220/09:PU81969 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Reliability of Electronic Devices: Failure Mechanisms and Testing

Popis výsledku v původním jazyce

Non-destructive methods for the quality characterization and reliability prediction of electronic devices are based on the VA characteristics, the nonlinearity index (NLI), electronic noise spectroscopy, electro-ultrasonic spectroscopy and acoustic emission. Leakage current value and its dependence on ageing time for the fixed temperature and applied voltage are frequently used as the reliability indicator for tantalum and niobium capacitors. It is shown that the self-healing processes can regenerate capacitor structure and then leakage current and noise decrease in affected samples. The frequency dependence of the noise spectral density in mHz region gives the information on slow irreversible processes. Acoustic emission and partial discharges signalscan be used to localise the defect position in the foil capacitors. A noise and nonlinearity of resistors are used for detecting imperfections and abnormalities. It is shown that electro-ultrasonic spectroscopy intermodulation component

Název v anglickém jazyce

Reliability of Electronic Devices: Failure Mechanisms and Testing

Popis výsledku anglicky

Non-destructive methods for the quality characterization and reliability prediction of electronic devices are based on the VA characteristics, the nonlinearity index (NLI), electronic noise spectroscopy, electro-ultrasonic spectroscopy and acoustic emission. Leakage current value and its dependence on ageing time for the fixed temperature and applied voltage are frequently used as the reliability indicator for tantalum and niobium capacitors. It is shown that the self-healing processes can regenerate capacitor structure and then leakage current and noise decrease in affected samples. The frequency dependence of the noise spectral density in mHz region gives the information on slow irreversible processes. Acoustic emission and partial discharges signalscan be used to localise the defect position in the foil capacitors. A noise and nonlinearity of resistors are used for detecting imperfections and abnormalities. It is shown that electro-ultrasonic spectroscopy intermodulation component

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2009

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Reliability, risk and safety

ISBN

978-0-415-55509-8

ISSN

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e-ISSN

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Počet stran výsledku

12

Strana od-do

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Název nakladatele

Taylor&Francis Group, London UK

Místo vydání

Great Britain

Místo konání akce

Praha

Datum konání akce

7. 9. 2009

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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