RELIABILITY OF PASSIVE ELECTRONIC DEVICES: FAILURE MECHANISMS AND TESTING

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU89312" target="_blank" >RIV/00216305:26220/10:PU89312 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

RELIABILITY OF PASSIVE ELECTRONIC DEVICES: FAILURE MECHANISMS AND TESTING

Popis výsledku v původním jazyce

Non-destructive methods for the quality characterization and reliability prediction of passive electronic devices are based on the VA characteristics, the nonlinearity index (NLI), electronic noise spectroscopy, and electro-ultrasonic spectroscopy. Leakage current value and its dependence on ageing time for the fixed temperature and applied voltage are frequently used as the reliability indicators for tantalum and niobium capacitors. It is shown that the self-healing processes can regenerate capacitor structure and then both leakage current and noise decrease in affected samples. The frequency dependence of the noise spectral density in mHz region gives the information on slow irreversible processes. Acoustic emission and partial discharges signals canbe used to localise the defect position in the foil capacitors. A noise and nonlinearity of resistors are used for detecting imperfections and abnormalities. It is shown that electro-ultrasonic spectroscopy intermodulation component is m

Název v anglickém jazyce

RELIABILITY OF PASSIVE ELECTRONIC DEVICES: FAILURE MECHANISMS AND TESTING

Popis výsledku anglicky

Non-destructive methods for the quality characterization and reliability prediction of passive electronic devices are based on the VA characteristics, the nonlinearity index (NLI), electronic noise spectroscopy, and electro-ultrasonic spectroscopy. Leakage current value and its dependence on ageing time for the fixed temperature and applied voltage are frequently used as the reliability indicators for tantalum and niobium capacitors. It is shown that the self-healing processes can regenerate capacitor structure and then both leakage current and noise decrease in affected samples. The frequency dependence of the noise spectral density in mHz region gives the information on slow irreversible processes. Acoustic emission and partial discharges signals canbe used to localise the defect position in the foil capacitors. A noise and nonlinearity of resistors are used for detecting imperfections and abnormalities. It is shown that electro-ultrasonic spectroscopy intermodulation component is m

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GA102%2F09%2F1920" target="_blank" >GA102/09/1920: Stochastické jevy v polovodičových strukturách MIS a MIM</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

CARTS USA 2010 PROCEEDINGS

ISBN

0-7908-0150-7

ISSN

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e-ISSN

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Počet stran výsledku

21

Strana od-do

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Název nakladatele

Electronic Components Association

Místo vydání

USA,New Orleans

Místo konání akce

New Orleans

Datum konání akce

15. 3. 2010

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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