Electron Beam Induced Mass Loss of Sensitive Materials

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F14%3APU117563" target="_blank" >RIV/00216305:26220/14:PU117563 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.morebooks.de/store/gb/book/electron-beam-induced-mass-loss-of-sensitive-materials/isbn/978-3-659-62843-6" target="_blank" >https://www.morebooks.de/store/gb/book/electron-beam-induced-mass-loss-of-sensitive-materials/isbn/978-3-659-62843-6</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Electron Beam Induced Mass Loss of Sensitive Materials

Popis výsledku v původním jazyce

The low voltage STEM is a very interesting but not well known method with great potential for examination of sensitive materials. This book is focused on the mass loss of the material caused by the electron beam in this microscope. The analysed materialswere pure embedding media (Epon, Spurr, LR White) and biological sample - Euglena gracilis embedded in them. The samples of different thicknesses were examined using different microscope settings (acceleration voltage, total dose, probe current, plasmacleaning) and the STEM imaging modes (bright-field, darkfield). Collected images, created algorithms and obtained results are widely discussed and supported by graphs and tables. A suggestion of an ideal experiment according to the measured data is presented. A description of physical principles of the TEM, the SEM and the STEM and their suitability for observation of samples sensitive to electrons is presented in the book. The interaction between the electron beam and the sample is also

Název v anglickém jazyce

Electron Beam Induced Mass Loss of Sensitive Materials

Popis výsledku anglicky

The low voltage STEM is a very interesting but not well known method with great potential for examination of sensitive materials. This book is focused on the mass loss of the material caused by the electron beam in this microscope. The analysed materialswere pure embedding media (Epon, Spurr, LR White) and biological sample - Euglena gracilis embedded in them. The samples of different thicknesses were examined using different microscope settings (acceleration voltage, total dose, probe current, plasmacleaning) and the STEM imaging modes (bright-field, darkfield). Collected images, created algorithms and obtained results are widely discussed and supported by graphs and tables. A suggestion of an ideal experiment according to the measured data is presented. A description of physical principles of the TEM, the SEM and the STEM and their suitability for observation of samples sensitive to electrons is presented in the book. The interaction between the electron beam and the sample is also

Druh

B - Odborná kniha

CEP obor

BO - Biofyzika

OECD FORD obor

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Projekt

<a href="/cs/project/LO1210" target="_blank" >LO1210: Energie v podmínkách udržitelného rozvoje (EN-PUR)</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

ISBN

978-3-659-62843-6

Počet stran knihy

128

Název nakladatele

LAP LAMBERT Academic Publishing

Místo vydání

Neuveden

Kód UT WoS knihy

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