Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F17%3APU124064" target="_blank" >RIV/00216305:26220/17:PU124064 - isvavai.cz</a>

Výsledek na webu

<a href="https://link.springer.com/article/10.1007/s10854-017-7422-4" target="_blank" >https://link.springer.com/article/10.1007/s10854-017-7422-4</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1007/s10854-017-7422-4" target="_blank" >10.1007/s10854-017-7422-4</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters

Popis výsledku v původním jazyce

The purpose of this work is surface characterization of GaAs solar cell using atomic force microscopy. The surface appearance influences the optical properties of the cells. It impacts light trapping and consequently affect the efficiency of the solar cells. In case of nano-structural surface, the properties are strongly depends on its geometrical characteristics. Surface appearance was studied by atomic force microscopy (AFM). Fractal analysis was done by the triangulation method and evaluation of statistical metrics was carrying out on the basis of AFM-data, before and after heating. The results of fractal analysis show the correlation of fractal dimension and statistical characteristics of surface topography. Characterization technique and data processing methodology are essential for description of the surface condition.

Název v anglickém jazyce

Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters

Popis výsledku anglicky

The purpose of this work is surface characterization of GaAs solar cell using atomic force microscopy. The surface appearance influences the optical properties of the cells. It impacts light trapping and consequently affect the efficiency of the solar cells. In case of nano-structural surface, the properties are strongly depends on its geometrical characteristics. Surface appearance was studied by atomic force microscopy (AFM). Fractal analysis was done by the triangulation method and evaluation of statistical metrics was carrying out on the basis of AFM-data, before and after heating. The results of fractal analysis show the correlation of fractal dimension and statistical characteristics of surface topography. Characterization technique and data processing methodology are essential for description of the surface condition.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS

ISSN

0957-4522

e-ISSN

1573-482X

Svazek periodika

28

Číslo periodika v rámci svazku

15

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

12

Strana od-do

1-12

Kód UT WoS článku

000412157300058

EID výsledku v databázi Scopus

2-s2.0-85021801778