Measurement and Optimization of an ECR Plasma Source
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F21%3APU145321" target="_blank" >RIV/00216305:26220/21:PU145321 - isvavai.cz</a>
Výsledek na webu
<a href="https://ieeexplore.ieee.org/document/9694823" target="_blank" >https://ieeexplore.ieee.org/document/9694823</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/PIERS53385.2021.9694823" target="_blank" >10.1109/PIERS53385.2021.9694823</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Measurement and Optimization of an ECR Plasma Source
Popis výsledku v původním jazyce
Electron cyclotron resonance (ECR) is a very common technique for various kinds of applications. Among others, it is widely used in the field of semiconductor or material industry, electron microscopy or plasmatic machining. This paper deals with an ECR source of plasma, which is used for ions generation. The plasma source uses the cyclotron resonance principle for Xenon gas ionization and efficient plasma generation. This technology is advantageous for selected application for several reasons, especially for a wide range of optimization options of the drive system. The used measurement methods are based on well-known information about the ion source and standard working conditions. Within this paper, we optimize the conditions to find out the best set of input parameters. The output of this experiment is a multidimensional map of the working conditions, essential to evaluate the dependences of variable working pressure, excitation energies and frequencies and to understand the consequences, arising from this complex measurement. The test environment is based on an electron microscope system, which is used for measuring and controlling all working conditions. Above that, an external high-frequency power source was used for plasma excitation. Such setup enables to set and tune all the parameters, collect measured information, and interpret them easily.
Název v anglickém jazyce
Measurement and Optimization of an ECR Plasma Source
Popis výsledku anglicky
Electron cyclotron resonance (ECR) is a very common technique for various kinds of applications. Among others, it is widely used in the field of semiconductor or material industry, electron microscopy or plasmatic machining. This paper deals with an ECR source of plasma, which is used for ions generation. The plasma source uses the cyclotron resonance principle for Xenon gas ionization and efficient plasma generation. This technology is advantageous for selected application for several reasons, especially for a wide range of optimization options of the drive system. The used measurement methods are based on well-known information about the ion source and standard working conditions. Within this paper, we optimize the conditions to find out the best set of input parameters. The output of this experiment is a multidimensional map of the working conditions, essential to evaluate the dependences of variable working pressure, excitation energies and frequencies and to understand the consequences, arising from this complex measurement. The test environment is based on an electron microscope system, which is used for measuring and controlling all working conditions. Above that, an external high-frequency power source was used for plasma excitation. Such setup enables to set and tune all the parameters, collect measured information, and interpret them easily.
Klasifikace
Druh
D - Stať ve sborníku
CEP obor
—
OECD FORD obor
20200 - Electrical engineering, Electronic engineering, Information engineering
Návaznosti výsledku
Projekt
—
Návaznosti
S - Specificky vyzkum na vysokych skolach
Ostatní
Rok uplatnění
2021
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název statě ve sborníku
2021 Photonics & Electromagnetics Research Symposium (PIERS)
ISBN
978-1-7281-7247-7
ISSN
1559-9450
e-ISSN
—
Počet stran výsledku
4
Strana od-do
358-361
Název nakladatele
IEEE
Místo vydání
NEW YORK
Místo konání akce
Hangzhou, China
Datum konání akce
21. 11. 2021
Typ akce podle státní příslušnosti
WRD - Celosvětová akce
Kód UT WoS článku
000795902300052