Overview and Impact of Faults in Grid-Connected Photovoltaic Systems
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F22%3APU146808" target="_blank" >RIV/00216305:26220/22:PU146808 - isvavai.cz</a>
Výsledek na webu
<a href="https://onlinelibrary.wiley.com/doi/abs/10.1002/9781119873785.ch1" target="_blank" >https://onlinelibrary.wiley.com/doi/abs/10.1002/9781119873785.ch1</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/9781119873785.ch1" target="_blank" >10.1002/9781119873785.ch1</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Overview and Impact of Faults in Grid-Connected Photovoltaic Systems
Popis výsledku v původním jazyce
This chapter discusses the fault in a grid-connected photovoltaic (PV) system along with it impact on the system and the method to identify such faults. It explains the fault related to the PV panel and power electronics converter in detail. The chapter also discusses a common fault in the inverters and the most vulnerable component, i.e. power electronics switch. With advances in semiconductor technology, insulated gate bipolar transistors (IGBTs) have become the best switching devices for power electronics applications. However, because of the intermediate circuit capacitors, it is one of the most susceptible components in grid-connected PV systems. IGBTs are prone to failure due to electrical, mechanical, and thermal overloads. There are two types of IGBT failures: wearout failure and catastrophic failure. Investigation of wear defects in IGBTs is very important to ensure the reliability of power electronics converters. The chapter discusses the fault detection strategies for PV system.
Název v anglickém jazyce
Overview and Impact of Faults in Grid-Connected Photovoltaic Systems
Popis výsledku anglicky
This chapter discusses the fault in a grid-connected photovoltaic (PV) system along with it impact on the system and the method to identify such faults. It explains the fault related to the PV panel and power electronics converter in detail. The chapter also discusses a common fault in the inverters and the most vulnerable component, i.e. power electronics switch. With advances in semiconductor technology, insulated gate bipolar transistors (IGBTs) have become the best switching devices for power electronics applications. However, because of the intermediate circuit capacitors, it is one of the most susceptible components in grid-connected PV systems. IGBTs are prone to failure due to electrical, mechanical, and thermal overloads. There are two types of IGBT failures: wearout failure and catastrophic failure. Investigation of wear defects in IGBTs is very important to ensure the reliability of power electronics converters. The chapter discusses the fault detection strategies for PV system.
Klasifikace
Druh
C - Kapitola v odborné knize
CEP obor
—
OECD FORD obor
20201 - Electrical and electronic engineering
Návaznosti výsledku
Projekt
—
Návaznosti
S - Specificky vyzkum na vysokych skolach
Ostatní
Rok uplatnění
2022
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název knihy nebo sborníku
Fault Analysis and its Impact on Grid-connected Photovoltaic Systems Performance
ISBN
9781119873785
Počet stran výsledku
42
Strana od-do
1-42
Počet stran knihy
329
Název nakladatele
John Wiley & Sons
Místo vydání
New York, United States
Kód UT WoS kapitoly
—