Characterization and Synthesis of Circuits at Extreme Low Temperatures

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F06%3APU66955" target="_blank" >RIV/00216305:26230/06:PU66955 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Characterization and Synthesis of Circuits at Extreme Low Temperatures

Popis výsledku v původním jazyce

This chapter describes circuit evolutionary experiments at extreme low temperatures, including the test of all system components at this extreme environment. Standard circuit designers have their target behavior limited to particular ranges of temperature, which usually does not achieve the extreme temperatures encoutered in some planets of our solar system. Our approach to this problem is the use of reconfigurable devices programmed by adaptive/evolutionary algorithms. Through reconfiguration, the newcharacteristics of the devices at extreme environment may be fully explored and correct functionality can be recovered. This chapter demonstrates this technique for circuit characterization, evolution and recovery at liquid nitrogen temperatures (-196.6C). In addition, preliminary tests are performed to assess the survivability limitations of the evolutionary processor at low temperatures.

Název v anglickém jazyce

Characterization and Synthesis of Circuits at Extreme Low Temperatures

Popis výsledku anglicky

This chapter describes circuit evolutionary experiments at extreme low temperatures, including the test of all system components at this extreme environment. Standard circuit designers have their target behavior limited to particular ranges of temperature, which usually does not achieve the extreme temperatures encoutered in some planets of our solar system. Our approach to this problem is the use of reconfigurable devices programmed by adaptive/evolutionary algorithms. Through reconfiguration, the newcharacteristics of the devices at extreme environment may be fully explored and correct functionality can be recovered. This chapter demonstrates this technique for circuit characterization, evolution and recovery at liquid nitrogen temperatures (-196.6C). In addition, preliminary tests are performed to assess the survivability limitations of the evolutionary processor at low temperatures.

Druh

C - Kapitola v odborné knize

CEP obor

JC - Počítačový hardware a software

OECD FORD obor

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Projekt

<a href="/cs/project/GP102%2F03%2FP004" target="_blank" >GP102/03/P004: Metody návrhu aplikací založených na vyvíjejících se obvodech</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2006

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název knihy nebo sborníku

Evolvable Hardware

ISBN

0-387-24386-0

Počet stran výsledku

12

Strana od-do

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Počet stran knihy

224

Název nakladatele

Springer Verlag

Místo vydání

Berlin

Kód UT WoS kapitoly

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