Low Power Testing

Kód výsledku v IS VaVaI

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Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Low Power Testing

Popis výsledku v původním jazyce

Portable computer systems and embedded systems are examples of electronic devices which are powered from batteries, therefore they are designed with the goal of low power consumption. Low power consumption becomes important not only during normal operational mode but during test application as well when switching activity is higher than in normal mode. In this chapter, a survey of basic concepts and methodologies from the area of low power testing is provided. First, it is explained how power consumption is related to switching activities during test application. Then, the concepts of static and dynamic power consumption are discussed together with metrics which can be possibly used to evaluate power consumption.  The survey of methods the goal of which is to reduce dynamic power consumption during test application is then provided followed by a short survey of power-constrained test scheduling methods.

Název v anglickém jazyce

Low Power Testing

Popis výsledku anglicky

Portable computer systems and embedded systems are examples of electronic devices which are powered from batteries, therefore they are designed with the goal of low power consumption. Low power consumption becomes important not only during normal operational mode but during test application as well when switching activity is higher than in normal mode. In this chapter, a survey of basic concepts and methodologies from the area of low power testing is provided. First, it is explained how power consumption is related to switching activities during test application. Then, the concepts of static and dynamic power consumption are discussed together with metrics which can be possibly used to evaluate power consumption.  The survey of methods the goal of which is to reduce dynamic power consumption during test application is then provided followed by a short survey of power-constrained test scheduling methods.

Druh

C - Kapitola v odborné knize

CEP obor

IN - Informatika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název knihy nebo sborníku

Design and Test Technology foír Dependable Systems-on-Chip

ISBN

978-1-60960-212-3

Počet stran výsledku

18

Strana od-do

395-412

Počet stran knihy

550

Název nakladatele

IGI Global

Místo vydání

Hershey

Kód UT WoS kapitoly

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