Nanolayered composites of plasma polymer films

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26310%2F09%3APU84447" target="_blank" >RIV/00216305:26310/09:PU84447 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Nanolayered composites of plasma polymer films

Popis výsledku v původním jazyce

Well-defined nanolayered composites of plasma polymer films, deposited from tetravinylsilane monomer at different powers by plasma-enhanced chemical vapor deposition on silicon, were in-tensively studied by in situ spectroscopic ellipsometry, nanoindentation, and atomic force micros-copy. A realistic model of the composite structure was used to analyze ellipsometric data and dis-tinguish individual layers in the composite, evaluate their thickness and optical constants. Disper-sion dependences for the refractive index were well separated for each type of individual layer, if the thickness was decreased 315 - 25 nm, and corresponded to those of the single layer. A beveled section of the nanolayered composite revealed the individual layers that were extensively investi-gated by atomic force microscopy (AFM) using height (Fig. 1), magnitude, phase, lateral force, and atomic force acoustic microscopy (AFAM) modes. Nanoindentation measurements were carried out in order to evaluate selected

Název v anglickém jazyce

Nanolayered composites of plasma polymer films

Popis výsledku anglicky

Well-defined nanolayered composites of plasma polymer films, deposited from tetravinylsilane monomer at different powers by plasma-enhanced chemical vapor deposition on silicon, were in-tensively studied by in situ spectroscopic ellipsometry, nanoindentation, and atomic force micros-copy. A realistic model of the composite structure was used to analyze ellipsometric data and dis-tinguish individual layers in the composite, evaluate their thickness and optical constants. Disper-sion dependences for the refractive index were well separated for each type of individual layer, if the thickness was decreased 315 - 25 nm, and corresponded to those of the single layer. A beveled section of the nanolayered composite revealed the individual layers that were extensively investi-gated by atomic force microscopy (AFM) using height (Fig. 1), magnitude, phase, lateral force, and atomic force acoustic microscopy (AFAM) modes. Nanoindentation measurements were carried out in order to evaluate selected

Druh

O - Ostatní výsledky

CEP obor

CF - Fyzikální chemie a teoretická chemie

OECD FORD obor

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Projekt

<a href="/cs/project/KAN101120701" target="_blank" >KAN101120701: Nanokompozitní vrstvy a nanočástice vytvářené v nízkotlakém plazmatu pro povrchové modifikace</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2009

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů