Characterization of electrophoretic suspension for thin polymer film deposition

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26310%2F12%3APU100113" target="_blank" >RIV/00216305:26310/12:PU100113 - isvavai.cz</a>

Výsledek na webu

<a href="http://iopscience.iop.org/1742-6596/356/1/012040/" target="_blank" >http://iopscience.iop.org/1742-6596/356/1/012040/</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Characterization of electrophoretic suspension for thin polymer film deposition

Popis výsledku v původním jazyce

Optical absorption and fluorescence spectra of poly[2-methoxy-5-(3',7'-dimethyloctyloxy)-1,4-phenylenevinylene] toluene solutions and 50:50% toluene/acetonitrile suspensions, show a clearly distinguished differences (e. g. peak broadening and shifting),which could be used for a characterization of suspensions with different acetonitrile content. The DLS measurement of the suspensions prepared shows a particle size of 90 nm. Thin films with thicknesses of about 400 nm were prepared by electrophoretic deposition (EPD) and spin coating. As the films are very soft non-contacting optical profilometer method, based on chromatic aberration was used to measure the thickness. AFM imaging of spin coated and EPD films shows film roughness of 20-40 nm and 40-80 nm, respectively. The film roughness of the EPD film seems to be less than the suspension particle size obtained by DLS method, due probably to the partial film dissolving by the presented in the suspension toluene.

Název v anglickém jazyce

Characterization of electrophoretic suspension for thin polymer film deposition

Popis výsledku anglicky

Optical absorption and fluorescence spectra of poly[2-methoxy-5-(3',7'-dimethyloctyloxy)-1,4-phenylenevinylene] toluene solutions and 50:50% toluene/acetonitrile suspensions, show a clearly distinguished differences (e. g. peak broadening and shifting),which could be used for a characterization of suspensions with different acetonitrile content. The DLS measurement of the suspensions prepared shows a particle size of 90 nm. Thin films with thicknesses of about 400 nm were prepared by electrophoretic deposition (EPD) and spin coating. As the films are very soft non-contacting optical profilometer method, based on chromatic aberration was used to measure the thickness. AFM imaging of spin coated and EPD films shows film roughness of 20-40 nm and 40-80 nm, respectively. The film roughness of the EPD film seems to be less than the suspension particle size obtained by DLS method, due probably to the partial film dissolving by the presented in the suspension toluene.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

CF - Fyzikální chemie a teoretická chemie

OECD FORD obor

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Projekt

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Návaznosti

R - Projekt Ramcoveho programu EK

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Physics: Conference Series

ISSN

1742-6596

e-ISSN

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Svazek periodika

356

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

4

Strana od-do

1-4

Kód UT WoS článku

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EID výsledku v databázi Scopus

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