CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F19%3APU131919" target="_blank" >RIV/00216305:26620/19:PU131919 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.ndt.net/search/docs.php3?showForm=off&id=23697" target="_blank" >https://www.ndt.net/search/docs.php3?showForm=off&id=23697</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography

Popis výsledku v původním jazyce

The key component of any CT (X-ray computed tomography) machine is a detection system. In area of scientific CT imaging applications three types of sensors are mainly used. These are amorphous silicon (α-Si) flat panels, complementary metal–oxide–semiconductor (CMOS) and charge-coupled device (CCD) sensors. Here the performance and comparison study of the two lastly named sensor types is conducted in field of high resolution CT imaging. CCD and novel sCMOS-based (scientific CMOS) detection systems are tested using high-resolution laboratory-based Rigaku nano3DX system (ability to achieve submicron voxel resolution). Properties of each camera were evaluated as well as the quality and noise properties of acquired data (both projectionand CT data).

Název v anglickém jazyce

CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography

Popis výsledku anglicky

The key component of any CT (X-ray computed tomography) machine is a detection system. In area of scientific CT imaging applications three types of sensors are mainly used. These are amorphous silicon (α-Si) flat panels, complementary metal–oxide–semiconductor (CMOS) and charge-coupled device (CCD) sensors. Here the performance and comparison study of the two lastly named sensor types is conducted in field of high resolution CT imaging. CCD and novel sCMOS-based (scientific CMOS) detection systems are tested using high-resolution laboratory-based Rigaku nano3DX system (ability to achieve submicron voxel resolution). Properties of each camera were evaluated as well as the quality and noise properties of acquired data (both projectionand CT data).

Druh

J_ost - Ostatní články v recenzovaných periodicích

CEP obor

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OECD FORD obor

20305 - Nuclear related engineering; (nuclear physics to be 1.3);

Projekt

<a href="/cs/project/LQ1601" target="_blank" >LQ1601: CEITEC 2020</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

The e-Journal of Nondestructive Testing

ISSN

1435-4934

e-ISSN

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Svazek periodika

neuveden

Číslo periodika v rámci svazku

2019

Stát vydavatele periodika

DE - Spolková republika Německo

Počet stran výsledku

8

Strana od-do

1-8

Kód UT WoS článku

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EID výsledku v databázi Scopus

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