Intrinsic properties of anodic TiO2 nanotube layers: In-situ XRD annealing of TiO2 nanotube layers

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F23%3APU147475" target="_blank" >RIV/00216305:26620/23:PU147475 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216275:25310/23:39920472

Výsledek na webu

<a href="https://www.sciencedirect.com/science/article/pii/S0272884222039992?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0272884222039992?via%3Dihub</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.ceramint.2022.11.032" target="_blank" >10.1016/j.ceramint.2022.11.032</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Intrinsic properties of anodic TiO2 nanotube layers: In-situ XRD annealing of TiO2 nanotube layers

Popis výsledku v původním jazyce

In this work, in-situ annealing of TiO2 nanotube (TNT) layers in an XRD chamber was carried out to investigate the crystallization process of the TNT layers in details. TNT layers of different thicknesses, i.e. 1, 5 and 20 μm, and of different morphology, i.e. double wall vs. single wall, were annealed in the temperature range from room temperature to 500 °C with two distinctly different annealing rates. Additionally, three different annealing atmospheres were explored, namely air as an oxidative, N2 as an inert, and 5%H2/95%N2 as a reductive atmosphere. XRD patterns were measured every 15 °C of the heating ramp and the crystallite sizes of anatase phase were calculated from the anatase peak using Scherer equation at each data point. The differences in crystallization behavior for the different TNT layers as well as the effect of the annealing atmosphere for 5 μm thick TNT layers are described and discussed.

Název v anglickém jazyce

Intrinsic properties of anodic TiO2 nanotube layers: In-situ XRD annealing of TiO2 nanotube layers

Popis výsledku anglicky

In this work, in-situ annealing of TiO2 nanotube (TNT) layers in an XRD chamber was carried out to investigate the crystallization process of the TNT layers in details. TNT layers of different thicknesses, i.e. 1, 5 and 20 μm, and of different morphology, i.e. double wall vs. single wall, were annealed in the temperature range from room temperature to 500 °C with two distinctly different annealing rates. Additionally, three different annealing atmospheres were explored, namely air as an oxidative, N2 as an inert, and 5%H2/95%N2 as a reductive atmosphere. XRD patterns were measured every 15 °C of the heating ramp and the crystallite sizes of anatase phase were calculated from the anatase peak using Scherer equation at each data point. The differences in crystallization behavior for the different TNT layers as well as the effect of the annealing atmosphere for 5 μm thick TNT layers are described and discussed.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10405 - Electrochemistry (dry cells, batteries, fuel cells, corrosion metals, electrolysis)

Projekt

—

Návaznosti

—

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Ceramics International

ISSN

0272-8842

e-ISSN

1873-3956

Svazek periodika

49

Číslo periodika v rámci svazku

14

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

9

Strana od-do

24293-24301

Kód UT WoS článku

001017504900001

EID výsledku v databázi Scopus

2-s2.0-85141959203