Characterization of field emission from oxidized copper emitters

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F24%3APU152192" target="_blank" >RIV/00216305:26620/24:PU152192 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68081723:_____/24:00598408

Výsledek na webu

<a href="https://iopscience.iop.org/article/10.1088/1402-4896/ad7232" target="_blank" >https://iopscience.iop.org/article/10.1088/1402-4896/ad7232</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1402-4896/ad7232" target="_blank" >10.1088/1402-4896/ad7232</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Characterization of field emission from oxidized copper emitters

Popis výsledku v původním jazyce

In this work, the field electron emission from oxidized copper emitters was studied by aging with radii in the range of 80-300 nm. The samples were prepared by an electrochemical etching method using an H3PO4 solution. The samples were exposed to air for 30 d to form an oxide film owing to aging. Measurements were carried out under high vacuum conditions in the range of 10-6 mbar. Scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM- EDS) was used to calculate the emitter radius, study the purity of the samples, and detect the oxide layers. Current-voltage (I-V) characteristics were studied and analyzed using Murphy-Goode (MG) plots and rectification tests. Furthermore, the spatial distribution of the electron emission and current stability were recorded and used to analyze the electron emission behavior of the tip surface. The trap density was also studied when the oxide layer was 3 layers thick. The results show that the emitters passed the orthodoxy test at low voltages. It was found that traps play an important role in increasing the switch-on current as the area of the oxide layer increases. It was found that the emitter acts as a point capacitor based on the charging and discharging processes of the electrons in the traps. The emission pattern showed great stability, which opens up prospects for this type of emitter in industry.

Název v anglickém jazyce

Characterization of field emission from oxidized copper emitters

Popis výsledku anglicky

In this work, the field electron emission from oxidized copper emitters was studied by aging with radii in the range of 80-300 nm. The samples were prepared by an electrochemical etching method using an H3PO4 solution. The samples were exposed to air for 30 d to form an oxide film owing to aging. Measurements were carried out under high vacuum conditions in the range of 10-6 mbar. Scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM- EDS) was used to calculate the emitter radius, study the purity of the samples, and detect the oxide layers. Current-voltage (I-V) characteristics were studied and analyzed using Murphy-Goode (MG) plots and rectification tests. Furthermore, the spatial distribution of the electron emission and current stability were recorded and used to analyze the electron emission behavior of the tip surface. The trap density was also studied when the oxide layer was 3 layers thick. The results show that the emitters passed the orthodoxy test at low voltages. It was found that traps play an important role in increasing the switch-on current as the area of the oxide layer increases. It was found that the emitter acts as a point capacitor based on the charging and discharging processes of the electrons in the traps. The emission pattern showed great stability, which opens up prospects for this type of emitter in industry.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

PHYSICA SCRIPTA

ISSN

0031-8949

e-ISSN

1402-4896

Svazek periodika

99

Číslo periodika v rámci svazku

10

Stát vydavatele periodika

SE - Švédské království

Počet stran výsledku

14

Strana od-do

„“-„“

Kód UT WoS článku

001308298300001

EID výsledku v databázi Scopus

2-s2.0-85203630001