Comparative analysis of surface layer functionality in STM and AFM probes: Effects of coating on emission characteristics

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F24%3APU152327" target="_blank" >RIV/00216305:26620/24:PU152327 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68081723:_____/24:00597951 RIV/68081731:_____/24:00597917

Výsledek na webu

<a href="https://sciendo.com/article/10.2478/jee-2024-0033" target="_blank" >https://sciendo.com/article/10.2478/jee-2024-0033</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.2478/jee-2024-0033" target="_blank" >10.2478/jee-2024-0033</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Comparative analysis of surface layer functionality in STM and AFM probes: Effects of coating on emission characteristics

Popis výsledku v původním jazyce

This study compares different types of scanning probe microscopy (SPM) probes according to the function of the surface layer at the tip apex. Three main types of SPM probes were analyzed: scanning tunneling microscopy (STM) tungsten probes, conductive atomic force microscopy (AFM) probes, and non-conductive AFM probes. The tungsten STM probes were coated with a graphite layer to simulate the effects of carbonization. The tested AFM probes were specifically NenoProbe conductive AFM probes (platinum-coated tip) and Akiyama non-conductive AFM probes coated with gold. The gold coating is intended to improve surface conductivity and help achieve a homogeneous, oxidation-resistant surface. The three samples were measured in a field emission microscope to study their current-voltage characteristics. The obtained current-voltage characteristics were tested and analyzed by the Forbes field emission orthodoxy test, providing the field emission parameters that correlate with the state of the scanning probe tip. In this study, the most important parameter is the formal emission area parameter, which indicates the formal tunneling current density through the probe tip-sample nanogap. For an STM tip, this reflects the size and shape of the region from which electrons tunnel to the sample surface. If this area is larger than expected or desired, it may indicate problems with tip function or tip wear. This information is critical for evaluating the performance and accuracy of the STM tip and can help diagnose problems and optimize its function.

Název v anglickém jazyce

Comparative analysis of surface layer functionality in STM and AFM probes: Effects of coating on emission characteristics

Popis výsledku anglicky

This study compares different types of scanning probe microscopy (SPM) probes according to the function of the surface layer at the tip apex. Three main types of SPM probes were analyzed: scanning tunneling microscopy (STM) tungsten probes, conductive atomic force microscopy (AFM) probes, and non-conductive AFM probes. The tungsten STM probes were coated with a graphite layer to simulate the effects of carbonization. The tested AFM probes were specifically NenoProbe conductive AFM probes (platinum-coated tip) and Akiyama non-conductive AFM probes coated with gold. The gold coating is intended to improve surface conductivity and help achieve a homogeneous, oxidation-resistant surface. The three samples were measured in a field emission microscope to study their current-voltage characteristics. The obtained current-voltage characteristics were tested and analyzed by the Forbes field emission orthodoxy test, providing the field emission parameters that correlate with the state of the scanning probe tip. In this study, the most important parameter is the formal emission area parameter, which indicates the formal tunneling current density through the probe tip-sample nanogap. For an STM tip, this reflects the size and shape of the region from which electrons tunnel to the sample surface. If this area is larger than expected or desired, it may indicate problems with tip function or tip wear. This information is critical for evaluating the performance and accuracy of the STM tip and can help diagnose problems and optimize its function.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20200 - Electrical engineering, Electronic engineering, Information engineering

Projekt

<a href="/cs/project/FW03010504" target="_blank" >FW03010504: Vývoj in-situ technik pro charakterizaci materiálů a nanostruktur</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Electrical Engineering

ISSN

1335-3632

e-ISSN

1339-309X

Svazek periodika

75

Číslo periodika v rámci svazku

4

Stát vydavatele periodika

SK - Slovenská republika

Počet stran výsledku

7

Strana od-do

268-274

Kód UT WoS článku

001288026300001

EID výsledku v databázi Scopus

2-s2.0-85201095770