Stitching accuracy in large area scanning probe microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F24%3APU154732" target="_blank" >RIV/00216305:26620/24:PU154732 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00177016:_____/24:N0000143 RIV/00216224:14310/24:00137935

Výsledek na webu

<a href="https://iopscience.iop.org/article/10.1088/1361-6501/ad7a13" target="_blank" >https://iopscience.iop.org/article/10.1088/1361-6501/ad7a13</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1361-6501/ad7a13" target="_blank" >10.1088/1361-6501/ad7a13</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Stitching accuracy in large area scanning probe microscopy

Popis výsledku v původním jazyce

Image stitching is a technique that can significantly enlarge the scan area of scanning probe microscope (SPM) images. It is also the most commonly used method to cover large areas in high-speed SPM. In this paper, we provide details on stitching algorithms developed specifically to mitigate the effects of SPM error sources, namely the presence of scanner non-flatness. Using both synthetic data and flat samples we analyse the potential uncertainty contributions related to stitching, showing that the drift and line mismatch are the dominant sources of uncertainty. We also present the 'flatten base' algorithm that can significantly improve the stitched data results, at the cost of losing the large area form information about the sample.

Název v anglickém jazyce

Stitching accuracy in large area scanning probe microscopy

Popis výsledku anglicky

Image stitching is a technique that can significantly enlarge the scan area of scanning probe microscope (SPM) images. It is also the most commonly used method to cover large areas in high-speed SPM. In this paper, we provide details on stitching algorithms developed specifically to mitigate the effects of SPM error sources, namely the presence of scanner non-flatness. Using both synthetic data and flat samples we analyse the potential uncertainty contributions related to stitching, showing that the drift and line mismatch are the dominant sources of uncertainty. We also present the 'flatten base' algorithm that can significantly improve the stitched data results, at the cost of losing the large area form information about the sample.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

21100 - Other engineering and technologies

Projekt

<a href="/cs/project/8B21006" target="_blank" >8B21006: Traceability of localised functional properties of nanostructures with high speed scanning probe microscopy</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Measurement Science and Technology

ISSN

0957-0233

e-ISSN

1361-6501

Svazek periodika

35

Číslo periodika v rámci svazku

12

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

12

Strana od-do

125026-125037

Kód UT WoS článku

001326872200001

EID výsledku v databázi Scopus

2-s2.0-85206075472