Kelvin Probe Force Microscopy (KPFM)

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F04525671%3A_____%2F23%3AN0000008" target="_blank" >RIV/04525671:_____/23:N0000008 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Kelvin Probe Force Microscopy (KPFM)

Popis výsledku v původním jazyce

An application note is a document detailing the use of a technique or application of an instrument. In the case of Kelvin Probe Force Microscopy (KPFM), it is a method of estimating the local distribution of surface potentials. KPFM uses lock-in amplifiers and measures the topography of the sample in contact mode in the first pass. Then the tip is lifted and repeats its trajectory in a second pass, where the electrical interaction between the tip and the sample is recorded without the influence of the topography. As an example application, a biodegradable alloy for advanced prosthetics is shown. The improvement of the mechanical properties of such materials is performed by accurately estimating the contact potential of the sample surface using KPFM. The surface of the sample has been modified by the focused ion beam technique, and with KPFM, true precipitates can be clearly distinguished from other surface irregularities.

Název v anglickém jazyce

Kelvin Probe Force Microscopy (KPFM)

Popis výsledku anglicky

An application note is a document detailing the use of a technique or application of an instrument. In the case of Kelvin Probe Force Microscopy (KPFM), it is a method of estimating the local distribution of surface potentials. KPFM uses lock-in amplifiers and measures the topography of the sample in contact mode in the first pass. Then the tip is lifted and repeats its trajectory in a second pass, where the electrical interaction between the tip and the sample is recorded without the influence of the topography. As an example application, a biodegradable alloy for advanced prosthetics is shown. The improvement of the mechanical properties of such materials is performed by accurately estimating the contact potential of the sample surface using KPFM. The surface of the sample has been modified by the focused ion beam technique, and with KPFM, true precipitates can be clearly distinguished from other surface irregularities.

Druh

O - Ostatní výsledky

CEP obor

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OECD FORD obor

21000 - Nano-technology

Projekt

<a href="/cs/project/FV40238" target="_blank" >FV40238: Pokročilé mikroskopické techniky</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2023

Kód důvěrnosti údajů

C - Předmět řešení projektu podléhá obchodnímu tajemství (§ 504 Občanského zákoníku), ale název projektu, cíle projektu a u ukončeného nebo zastaveného projektu zhodnocení výsledku řešení projektu (údaje P03, P04, P15, P19, P29, PN8) dodané do CEP, jsou upraveny tak, aby byly zveřejnitelné.