Failure of electric devices due to H2S
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F25794787%3A_____%2F17%3AN0000037" target="_blank" >RIV/25794787:_____/17:N0000037 - isvavai.cz</a>
Výsledek na webu
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DOI - Digital Object Identifier
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Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Failure of electric devices due to H2S
Popis výsledku v původním jazyce
Copper is widely used metal for industrial and public purposes due to its good corrosion resistance and excellent electrical conductivity. In indoor atmospheric environments without air pollution the corrosion rate of copper is very low and it is not affected by slight increasing of temperature or relative humidity. In many indoor environment hydrogen sulphide (H2S) occurs and significantly affects the copper corrosion. CuS is a loose of black corrosion product which can’t form protective film on copper surface and promote corrosion by adsorption of moisture as carrier. In the case of HS- presence, the corrosion product is chalcocite Cu2S. Copper corrosion attack by H2S low concentration caused significant failure of electronic, electric equipment but also other copper parts as tubes, etc. These corrosion films can form an insulating layer on the contact surfaces causing electrical failures on the electronic devices. This paper is contained in Proceedings of EUROCORR 2017 (Prague, Czech Republic).
Název v anglickém jazyce
Failure of electric devices due to H2S
Popis výsledku anglicky
Copper is widely used metal for industrial and public purposes due to its good corrosion resistance and excellent electrical conductivity. In indoor atmospheric environments without air pollution the corrosion rate of copper is very low and it is not affected by slight increasing of temperature or relative humidity. In many indoor environment hydrogen sulphide (H2S) occurs and significantly affects the copper corrosion. CuS is a loose of black corrosion product which can’t form protective film on copper surface and promote corrosion by adsorption of moisture as carrier. In the case of HS- presence, the corrosion product is chalcocite Cu2S. Copper corrosion attack by H2S low concentration caused significant failure of electronic, electric equipment but also other copper parts as tubes, etc. These corrosion films can form an insulating layer on the contact surfaces causing electrical failures on the electronic devices. This paper is contained in Proceedings of EUROCORR 2017 (Prague, Czech Republic).
Klasifikace
Druh
O - Ostatní výsledky
CEP obor
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OECD FORD obor
10405 - Electrochemistry (dry cells, batteries, fuel cells, corrosion metals, electrolysis)
Návaznosti výsledku
Projekt
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Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2017
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů