Spatially resolved XRD using polychromatic fan beam and a hybrid pixel detectors Timepix3

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F26316919%3A_____%2F25%3AN0000039" target="_blank" >RIV/26316919:_____/25:N0000039 - isvavai.cz</a>

Výsledek na webu

<a href="https://iopscience.iop.org/article/10.1088/1748-0221/20/07/C07035" target="_blank" >https://iopscience.iop.org/article/10.1088/1748-0221/20/07/C07035</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1748-0221/20/07/C07035" target="_blank" >10.1088/1748-0221/20/07/C07035</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Spatially resolved XRD using polychromatic fan beam and a hybrid pixel detectors Timepix3

Popis výsledku v původním jazyce

The utilization of hybrid pixelated detectors such as Timepix3 for imaging has already been proven to have many benefits compared to conventional detectors, e.g. CCDs. The proposed work exploits these benefits for material structure analysis using x-ray diffraction (XRD) with a polychromatic fan beam. This allows simultaneous analysis of material properties and thus provides spatially resolved information about differences in the sample structure, e.g. material impurities or uneven sample treatment. The proposed measurement setup utilizes two Timepix3 detectors, an off-the-shelf x-ray tube and a simple geometry, enabling in situ measurements. The data provided by the Timepix3 detector contain both spatial and energy information for each detected photon and therefore advantages of a polychromatic beam can be fully exploited. Thanks to the polychromatic beam, clusters, formed by grain orientation can be tracked and its origin can be restored. This then allows the correct scattering angle calculation while providing location of the corresponding grain.

Název v anglickém jazyce

Spatially resolved XRD using polychromatic fan beam and a hybrid pixel detectors Timepix3

Popis výsledku anglicky

The utilization of hybrid pixelated detectors such as Timepix3 for imaging has already been proven to have many benefits compared to conventional detectors, e.g. CCDs. The proposed work exploits these benefits for material structure analysis using x-ray diffraction (XRD) with a polychromatic fan beam. This allows simultaneous analysis of material properties and thus provides spatially resolved information about differences in the sample structure, e.g. material impurities or uneven sample treatment. The proposed measurement setup utilizes two Timepix3 detectors, an off-the-shelf x-ray tube and a simple geometry, enabling in situ measurements. The data provided by the Timepix3 detector contain both spatial and energy information for each detected photon and therefore advantages of a polychromatic beam can be fully exploited. Thanks to the polychromatic beam, clusters, formed by grain orientation can be tracked and its origin can be restored. This then allows the correct scattering angle calculation while providing location of the corresponding grain.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20501 - Materials engineering

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2025

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

JOURNAL OF INSTRUMENTATION

ISSN

—

e-ISSN

1748-0221

Svazek periodika

20

Číslo periodika v rámci svazku

7

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

9

Strana od-do

nestránkováno

Kód UT WoS článku

001530689400001

EID výsledku v databázi Scopus

2-s2.0-105010343001