X-ray Diffraction Analysis of Steel with Oxidised Surface Layer

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24210%2F16%3A00000598" target="_blank" >RIV/46747885:24210/16:00000598 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/46747885:24620/16:00000598

Výsledek na webu

<a href="http://www.scientific.net/DDF.368.99" target="_blank" >http://www.scientific.net/DDF.368.99</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.4028/www.scientific.net/DDF.368.99" target="_blank" >10.4028/www.scientific.net/DDF.368.99</a>

Jazyk výsledku

angličtina

Název v původním jazyce

X-ray Diffraction Analysis of Steel with Oxidised Surface Layer

Popis výsledku v původním jazyce

The basic principle of the X-ray diffraction analysis is based on the determination of components of residual stresses. They are determined on the basis of the change in the distance between atomic planes. The method is limited by a relatively small depth in which the X-ray beam penetrates into the analysed materials. For determination of residual stresses in the surface layer the X-ray diffraction and electrolytic polishing has to be combined. The article is deals with the determination of residual stress and real material structure of a laser-welded steel sample with an oxide surface layer. This surface layer is created during the rolling and it prevents the material from its corrosion. Before the X-ray diffraction analysis can be performed, this surface layer has to be removed. This surface layer cannot be removed with the help of electrolytic polishing and, therefore, it has to be removed mechanically. This mechanical procedure creates “technological” residual stress in the surface layer. This additional residual stress is removed by the electrolytic polishing in the depth between 20 and 80 µm. Finally, the real structure and residual stresses can be determined by using the X-ray diffraction techniques.

Název v anglickém jazyce

X-ray Diffraction Analysis of Steel with Oxidised Surface Layer

Popis výsledku anglicky

The basic principle of the X-ray diffraction analysis is based on the determination of components of residual stresses. They are determined on the basis of the change in the distance between atomic planes. The method is limited by a relatively small depth in which the X-ray beam penetrates into the analysed materials. For determination of residual stresses in the surface layer the X-ray diffraction and electrolytic polishing has to be combined. The article is deals with the determination of residual stress and real material structure of a laser-welded steel sample with an oxide surface layer. This surface layer is created during the rolling and it prevents the material from its corrosion. Before the X-ray diffraction analysis can be performed, this surface layer has to be removed. This surface layer cannot be removed with the help of electrolytic polishing and, therefore, it has to be removed mechanically. This mechanical procedure creates “technological” residual stress in the surface layer. This additional residual stress is removed by the electrolytic polishing in the depth between 20 and 80 µm. Finally, the real structure and residual stresses can be determined by using the X-ray diffraction techniques.

Druh

D - Stať ve sborníku

CEP obor

JP - Průmyslové procesy a zpracování

OECD FORD obor

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Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Defect and Diffusion Forum Volume 368

ISBN

978-3-03835-720-9

ISSN

1012-0386

e-ISSN

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Počet stran výsledku

4

Strana od-do

99-102

Název nakladatele

Trans Tech Publication

Místo vydání

Pfaffikon - Switzerland

Místo konání akce

Liberec

Datum konání akce

1. 1. 2015

Typ akce podle státní příslušnosti

EUR - Evropská akce

Kód UT WoS článku

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