Characterization of microstructure of crept samples of dissimilar weld joint using standard and advanced electron microscopy techniques
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F47718684%3A_____%2F20%3AN0000047" target="_blank" >RIV/47718684:_____/20:N0000047 - isvavai.cz</a>
Výsledek na webu
<a href="http://www.scientific.net" target="_blank" >http://www.scientific.net</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.4028/www.scientific.net/DDF.405.294" target="_blank" >10.4028/www.scientific.net/DDF.405.294</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Characterization of microstructure of crept samples of dissimilar weld joint using standard and advanced electron microscopy techniques
Popis výsledku v původním jazyce
Conventional long-term creep test (CCT) to the rupture and so called accelerated creep test (ACT) of the dissimilar weld joint made of FB2 and F martensitic steels and of the base materials were carried out at temperatures ranging from 550 °C to 650 °C in the stress range from 70 to 220 MPa. Assessment of microstructure development and changes of hardness was correlated with the creep strength. During creep at temperatures above 575 °C Laves phase precipitated in all parts of the weld joint and especially in the heat affected zones. Coarse Laves phase particles and their clusters with chromium carbides served as nucleation centers for cavities. As the fine grained heat affected zone of F steel was the softest part of the weld joint, many cavities originated and cause failure of samples. Microstructure of tested samples was evaluated The aim of this paper is to compare results and possibilities of the “standard” methods and advanced scanning electron microscopy performed by instrument equipped with a concentric backscatter electron detector (CBS). Filtering of the signal enables improving and/or diminishing of selected type of contrast caused by various types of particles of secondary phases. The images were used as an input data for image analysis and developments of microstructures during CCT and ACT were compared. Results have shown that specimens after ACT contains significantly lower content of the Laves phase.
Název v anglickém jazyce
Characterization of microstructure of crept samples of dissimilar weld joint using standard and advanced electron microscopy techniques
Popis výsledku anglicky
Conventional long-term creep test (CCT) to the rupture and so called accelerated creep test (ACT) of the dissimilar weld joint made of FB2 and F martensitic steels and of the base materials were carried out at temperatures ranging from 550 °C to 650 °C in the stress range from 70 to 220 MPa. Assessment of microstructure development and changes of hardness was correlated with the creep strength. During creep at temperatures above 575 °C Laves phase precipitated in all parts of the weld joint and especially in the heat affected zones. Coarse Laves phase particles and their clusters with chromium carbides served as nucleation centers for cavities. As the fine grained heat affected zone of F steel was the softest part of the weld joint, many cavities originated and cause failure of samples. Microstructure of tested samples was evaluated The aim of this paper is to compare results and possibilities of the “standard” methods and advanced scanning electron microscopy performed by instrument equipped with a concentric backscatter electron detector (CBS). Filtering of the signal enables improving and/or diminishing of selected type of contrast caused by various types of particles of secondary phases. The images were used as an input data for image analysis and developments of microstructures during CCT and ACT were compared. Results have shown that specimens after ACT contains significantly lower content of the Laves phase.
Klasifikace
Druh
J<sub>SC</sub> - Článek v periodiku v databázi SCOPUS
CEP obor
—
OECD FORD obor
20501 - Materials engineering
Návaznosti výsledku
Projekt
<a href="/cs/project/TE01020118" target="_blank" >TE01020118: Elektronová mikroskopie</a><br>
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2020
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Defect and Diffusion Forum
ISSN
1012-0386
e-ISSN
—
Svazek periodika
405
Číslo periodika v rámci svazku
1
Stát vydavatele periodika
CH - Švýcarská konfederace
Počet stran výsledku
6
Strana od-do
294-299
Kód UT WoS článku
—
EID výsledku v databázi Scopus
2-s2.0-85097623310