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Characterization of Microstructure of Crept Samples of Dissimilar WeldnJoint Using Standard and Advanced Electron Microscopy Techniques

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F20%3A00535536" target="_blank" >RIV/68081731:_____/20:00535536 - isvavai.cz</a>

  • Výsledek na webu

    <a href="https://www.scientific.net/DDF.405.294" target="_blank" >https://www.scientific.net/DDF.405.294</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.4028/www.scientific.net/DDF.405.294" target="_blank" >10.4028/www.scientific.net/DDF.405.294</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Characterization of Microstructure of Crept Samples of Dissimilar WeldnJoint Using Standard and Advanced Electron Microscopy Techniques

  • Popis výsledku v původním jazyce

    Conventional long-term creep test (CCT) to the rupture and so called accelerated creepntest (ACT) of the dissimilar weld joint made of FB2 and F martensitic steels and of the basenmaterials were carried out at temperatures ranging from 550 °C to 650 °C in the stress range from 70 to 220 MPa. Assessment of microstructure development and changes of hardness was correlated with the creep strength. During creep at temperatures above 575 °C Laves phase precipitated in all parts of the weld joint and especially in the heat affected zones. Coarse Laves phase particles and their clusters with chromium carbides served as nucleation centers for cavities. As the fine grained heat affected zone of F steel was the softest part of the weld joint, many cavities originated and cause failure of samples. The aim of this paper is to compare results and possibilities of the “standard” methods and advanced scanning electron microscopy performed by instrument equipped with a concentric backscatter electron detector (CBS). Filtering of the signal enables improvingnand/or diminishing of selected type of contrast caused by various types of particles of secondary phases. The images were used as an input data for image analysis and developments of microstructures during CCT and ACT were compared. Results have shown that specimens afterACT contains significantly lower content of the Laves phase.

  • Název v anglickém jazyce

    Characterization of Microstructure of Crept Samples of Dissimilar WeldnJoint Using Standard and Advanced Electron Microscopy Techniques

  • Popis výsledku anglicky

    Conventional long-term creep test (CCT) to the rupture and so called accelerated creepntest (ACT) of the dissimilar weld joint made of FB2 and F martensitic steels and of the basenmaterials were carried out at temperatures ranging from 550 °C to 650 °C in the stress range from 70 to 220 MPa. Assessment of microstructure development and changes of hardness was correlated with the creep strength. During creep at temperatures above 575 °C Laves phase precipitated in all parts of the weld joint and especially in the heat affected zones. Coarse Laves phase particles and their clusters with chromium carbides served as nucleation centers for cavities. As the fine grained heat affected zone of F steel was the softest part of the weld joint, many cavities originated and cause failure of samples. The aim of this paper is to compare results and possibilities of the “standard” methods and advanced scanning electron microscopy performed by instrument equipped with a concentric backscatter electron detector (CBS). Filtering of the signal enables improvingnand/or diminishing of selected type of contrast caused by various types of particles of secondary phases. The images were used as an input data for image analysis and developments of microstructures during CCT and ACT were compared. Results have shown that specimens afterACT contains significantly lower content of the Laves phase.

Klasifikace

  • Druh

    J<sub>SC</sub> - Článek v periodiku v databázi SCOPUS

  • CEP obor

  • OECD FORD obor

    20501 - Materials engineering

Návaznosti výsledku

  • Projekt

    <a href="/cs/project/TE01020118" target="_blank" >TE01020118: Elektronová mikroskopie</a><br>

  • Návaznosti

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Ostatní

  • Rok uplatnění

    2020

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název periodika

    Defect and Diffusion Forum

  • ISSN

    1662-9507

  • e-ISSN

  • Svazek periodika

    405

  • Číslo periodika v rámci svazku

    NOV

  • Stát vydavatele periodika

    CH - Švýcarská konfederace

  • Počet stran výsledku

    6

  • Strana od-do

    294-299

  • Kód UT WoS článku

  • EID výsledku v databázi Scopus

    2-s2.0-85097623310