Dispersive white-light spectral interferometry to measure distances and displacements

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F47813059%3A19240%2F02%3A20000003" target="_blank" >RIV/47813059:19240/02:20000003 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

Dispersive white-light spectral interferometry to measure distances and displacements

Popis výsledku v původním jazyce

Processing of the spectral interferograms recorded at the output of a dispersive Michelson interferometer by a low-resolution spectrometer is performed with a knowledge of both dispersion and thickness of the interferometer optical element (beam splitteror optical sample). The recorded spectral interferograms, including the equalization wavelengths, are fitted by using a least-squares method to the theoretical interferograms to obtain the optical path differences (OPDs) between interfering beams. From the OPDs, which vary with both the wavelength-dependent refractive index and the thickness of fused-silica optical element, distances or displacements are determined. Within two different configurations of a dispersive Michelson interferometer we show that the range of measurable distances depends on the thickness of the optical element. We also confirm by this measurement technique that errors of manually adjusted 10 micro m dispalcements of the interferometer mirror are below 1 micro m.

Název v anglickém jazyce

Dispersive white-light spectral interferometry to measure distances and displacements

Popis výsledku anglicky

Processing of the spectral interferograms recorded at the output of a dispersive Michelson interferometer by a low-resolution spectrometer is performed with a knowledge of both dispersion and thickness of the interferometer optical element (beam splitteror optical sample). The recorded spectral interferograms, including the equalization wavelengths, are fitted by using a least-squares method to the theoretical interferograms to obtain the optical path differences (OPDs) between interfering beams. From the OPDs, which vary with both the wavelength-dependent refractive index and the thickness of fused-silica optical element, distances or displacements are determined. Within two different configurations of a dispersive Michelson interferometer we show that the range of measurable distances depends on the thickness of the optical element. We also confirm by this measurement technique that errors of manually adjusted 10 micro m dispalcements of the interferometer mirror are below 1 micro m.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BH - Optika, masery a lasery

OECD FORD obor

—

Projekt

<a href="/cs/project/GA202%2F01%2F0077" target="_blank" >GA202/01/0077: Vlnovodné a magnetooptické reflexní jevy v tenkých vrstvách a nízkodimenzionálních systémech</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2002

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Optics Communications

ISSN

0030-4018

e-ISSN

—

Svazek periodika

212

Číslo periodika v rámci svazku

1-3

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

5

Strana od-do

65-70

Kód UT WoS článku

—

EID výsledku v databázi Scopus

—