Method of Connecting Printed and Embroidered Conductive Paths in Smart Textiles
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F22%3A43965455" target="_blank" >RIV/49777513:23220/22:43965455 - isvavai.cz</a>
Výsledek na webu
<a href="https://ieeexplore.ieee.org/document/9812714" target="_blank" >https://ieeexplore.ieee.org/document/9812714</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/ISSE54558.2022.9812714" target="_blank" >10.1109/ISSE54558.2022.9812714</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Method of Connecting Printed and Embroidered Conductive Paths in Smart Textiles
Popis výsledku v původním jazyce
This paper proposes a method of connecting conductive paths realized by embroidering and printing in smart textiles. The embroidering of conductive threads offers great electrical conductivity and the level of integration while technologies of printed electronics offer the realization of fine details. Connection is realized by overstitch of the printed contact pad. The durability of the connection is further improved with overprinting with conductive paste and encapsulation by lamination. Contact resistance and its change during the cyclic mechanical stress test and thermal shock test is measured. The proposed connection shows reliability during the thermal shock test as contact resistance is not affected. Also, during the cyclic mechanical stress test, the reliability and durability are observed.
Název v anglickém jazyce
Method of Connecting Printed and Embroidered Conductive Paths in Smart Textiles
Popis výsledku anglicky
This paper proposes a method of connecting conductive paths realized by embroidering and printing in smart textiles. The embroidering of conductive threads offers great electrical conductivity and the level of integration while technologies of printed electronics offer the realization of fine details. Connection is realized by overstitch of the printed contact pad. The durability of the connection is further improved with overprinting with conductive paste and encapsulation by lamination. Contact resistance and its change during the cyclic mechanical stress test and thermal shock test is measured. The proposed connection shows reliability during the thermal shock test as contact resistance is not affected. Also, during the cyclic mechanical stress test, the reliability and durability are observed.
Klasifikace
Druh
D - Stať ve sborníku
CEP obor
—
OECD FORD obor
20201 - Electrical and electronic engineering
Návaznosti výsledku
Projekt
—
Návaznosti
S - Specificky vyzkum na vysokych skolach
Ostatní
Rok uplatnění
2022
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název statě ve sborníku
2022 45th International Spring Seminar on Electronics Technology : /proceedings/
ISBN
978-1-66546-589-2
ISSN
2161-2536
e-ISSN
2161-2536
Počet stran výsledku
6
Strana od-do
1-6
Název nakladatele
IEEE
Místo vydání
Piscaway
Místo konání akce
Vienna, Austria
Datum konání akce
11. 5. 2022
Typ akce podle státní příslušnosti
WRD - Celosvětová akce
Kód UT WoS článku
000853642200006