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Thermal Cycle Testing of Printed Circuit Board Vias (Barrel Plates)

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F18%3A00325945" target="_blank" >RIV/68407700:21230/18:00325945 - isvavai.cz</a>

  • Výsledek na webu

  • DOI - Digital Object Identifier

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Thermal Cycle Testing of Printed Circuit Board Vias (Barrel Plates)

  • Popis výsledku v původním jazyce

    Printed circuit board (PCB) reliability is a very important factor from the point of total quality of output products. The ambient environment has influence on the reliability of PCBs and various issues can appear during its lifetime, even if the PCB properly passes the quality control before and after its assembly. This article deals with reliability test-monitoring of resistance behavior of the printed circuit board vias (barrel plates) during thermal stress (shock test). Appropriate printed circuit boards have been designed for this purpose. PCB sample was double-sided, vias were connected serially and PCB design allowed the use of four wire measurement method for measuring of all vias at once. The temperature sensor Pt100 was attached onto the PCB for better temperature monitoring of PCB during shock test. The shock test cycle took 20 minutes, the temperature of hot zone was set to 160 degrees C and the temperature of cool zone was -60 degrees C. The experiments help in understanding the barrel plate behavior during thermal stress, when the thermal expansion of composite substrate (glass-epoxy laminate) cause force (Young's modules), which stretches the barrel plate from the middle outwards. The identification of faulty vias is not easy during ambient temperature, it is easier when a measurement is conducted during thermal cycling or when the PCB is heated.

  • Název v anglickém jazyce

    Thermal Cycle Testing of Printed Circuit Board Vias (Barrel Plates)

  • Popis výsledku anglicky

    Printed circuit board (PCB) reliability is a very important factor from the point of total quality of output products. The ambient environment has influence on the reliability of PCBs and various issues can appear during its lifetime, even if the PCB properly passes the quality control before and after its assembly. This article deals with reliability test-monitoring of resistance behavior of the printed circuit board vias (barrel plates) during thermal stress (shock test). Appropriate printed circuit boards have been designed for this purpose. PCB sample was double-sided, vias were connected serially and PCB design allowed the use of four wire measurement method for measuring of all vias at once. The temperature sensor Pt100 was attached onto the PCB for better temperature monitoring of PCB during shock test. The shock test cycle took 20 minutes, the temperature of hot zone was set to 160 degrees C and the temperature of cool zone was -60 degrees C. The experiments help in understanding the barrel plate behavior during thermal stress, when the thermal expansion of composite substrate (glass-epoxy laminate) cause force (Young's modules), which stretches the barrel plate from the middle outwards. The identification of faulty vias is not easy during ambient temperature, it is easier when a measurement is conducted during thermal cycling or when the PCB is heated.

Klasifikace

  • Druh

    D - Stať ve sborníku

  • CEP obor

  • OECD FORD obor

    20201 - Electrical and electronic engineering

Návaznosti výsledku

  • Projekt

  • Návaznosti

    S - Specificky vyzkum na vysokych skolach

Ostatní

  • Rok uplatnění

    2018

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název statě ve sborníku

    2018 41st International Spring Seminar on Electronics Technology (ISSE)

  • ISBN

    978-3-319-73847-5

  • ISSN

    2161-2536

  • e-ISSN

  • Počet stran výsledku

    4

  • Strana od-do

  • Název nakladatele

    IEEE

  • Místo vydání

    NEW YORK, NY

  • Místo konání akce

    Zlatibor, Serbia

  • Datum konání akce

    16. 5. 2018

  • Typ akce podle státní příslušnosti

    WRD - Celosvětová akce

  • Kód UT WoS článku

    000449866600005