Mechanical characterization of a-C:H:SiOx coatings synthesized using radio-frequency plasma-assisted chemical vapor deposition method
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23520%2F15%3A43925957" target="_blank" >RIV/49777513:23520/15:43925957 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/46747885:24620/15:00002099
Výsledek na webu
<a href="http://dx.doi.org/10.1016/j.tsf.2015.08.017" target="_blank" >http://dx.doi.org/10.1016/j.tsf.2015.08.017</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.tsf.2015.08.017" target="_blank" >10.1016/j.tsf.2015.08.017</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Mechanical characterization of a-C:H:SiOx coatings synthesized using radio-frequency plasma-assisted chemical vapor deposition method
Popis výsledku v původním jazyce
A series of silicone-oxide containing hydrogenated amorphous carbon (a-C:H:SiOx) was deposited on polished silicon substrates by radio-frequency plasma assisted chemical vapour deposition method using methane and hexamethyldisiloxane. Three methane/hexamathyldisiloxane flow ratios and four self-bias voltages were applied for the synthesis of different a-C:H:SiOx coatings having different properties and silicon/oxygen concentrations. The chemical structure of the deposited films was determined by Fourier transform infrared spectroscopy. Detailed characterisation of the mechanical properties of SiOx incorporated carbon coatings was made using the nanoindentation (hardness and modulus) and profillometry (residual stress) methods. Hardness and elastic modulus were used for evaluation of the endurance capability and resistance to plastic deformation. The elastic recovery was calculated based on loading and unloading curves. The residual stress of diamond-like carbon coatings can be effectively reduced by the incorporation of SiOx. The mechanism of reducing the residual stress depending on the applied self-bias voltage is proposed. In the case of all of the examined coatings the addition of SiOx reduces the hardness, while for high self-bias voltages and increase of endurance capability and resistance to plastic deformation is observed.
Název v anglickém jazyce
Mechanical characterization of a-C:H:SiOx coatings synthesized using radio-frequency plasma-assisted chemical vapor deposition method
Popis výsledku anglicky
A series of silicone-oxide containing hydrogenated amorphous carbon (a-C:H:SiOx) was deposited on polished silicon substrates by radio-frequency plasma assisted chemical vapour deposition method using methane and hexamethyldisiloxane. Three methane/hexamathyldisiloxane flow ratios and four self-bias voltages were applied for the synthesis of different a-C:H:SiOx coatings having different properties and silicon/oxygen concentrations. The chemical structure of the deposited films was determined by Fourier transform infrared spectroscopy. Detailed characterisation of the mechanical properties of SiOx incorporated carbon coatings was made using the nanoindentation (hardness and modulus) and profillometry (residual stress) methods. Hardness and elastic modulus were used for evaluation of the endurance capability and resistance to plastic deformation. The elastic recovery was calculated based on loading and unloading curves. The residual stress of diamond-like carbon coatings can be effectively reduced by the incorporation of SiOx. The mechanism of reducing the residual stress depending on the applied self-bias voltage is proposed. In the case of all of the examined coatings the addition of SiOx reduces the hardness, while for high self-bias voltages and increase of endurance capability and resistance to plastic deformation is observed.
Klasifikace
Druh
J<sub>x</sub> - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
CEP obor
JJ - Ostatní materiály
OECD FORD obor
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Návaznosti výsledku
Projekt
Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2015
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Thin Solid Films
ISSN
0040-6090
e-ISSN
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Svazek periodika
590
Číslo periodika v rámci svazku
SEP 1
Stát vydavatele periodika
CH - Švýcarská konfederace
Počet stran výsledku
7
Strana od-do
299-305
Kód UT WoS článku
000361057100045
EID výsledku v databázi Scopus
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