Understanding the ion and atom fluxes during HiPIMS deposition of NbC from a compound target
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23520%2F23%3A43970250" target="_blank" >RIV/49777513:23520/23:43970250 - isvavai.cz</a>
Výsledek na webu
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DOI - Digital Object Identifier
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Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Understanding the ion and atom fluxes during HiPIMS deposition of NbC from a compound target
Popis výsledku v původním jazyce
This study focuses on understanding the plasma processes leading to the transition from C-rich to stoichiometric NbC films. To study the processes, time-averaged mass spectroscopy, spatial-resolved optical emission spectroscopy (OES), and plasma modelling were used to estimate fluxes of Nb and C atoms and ions at various positions within the discharge plasma. Our findings indicate that even at low power densities, the density of Nb ions remains significant, primarily due to their lower ionization energy and larger ionization cross-section compared to C atoms. However, the film growth is driven by the flux of neutral carbon, resulting in excess free carbon in the deposited film. Increasing the pulse power density, and higher ionization efficiencies lead to greater C ionization; however, neutral C still dominates the flux of C species to the film. Ionized C is affected by the back-attraction effect, and neutral C might also be increasingly affected by scattering with Nb. Consequently, this results in the deposition of nearly stoichiometric films using the highest pulse power density and shortest pulse length.
Název v anglickém jazyce
Understanding the ion and atom fluxes during HiPIMS deposition of NbC from a compound target
Popis výsledku anglicky
This study focuses on understanding the plasma processes leading to the transition from C-rich to stoichiometric NbC films. To study the processes, time-averaged mass spectroscopy, spatial-resolved optical emission spectroscopy (OES), and plasma modelling were used to estimate fluxes of Nb and C atoms and ions at various positions within the discharge plasma. Our findings indicate that even at low power densities, the density of Nb ions remains significant, primarily due to their lower ionization energy and larger ionization cross-section compared to C atoms. However, the film growth is driven by the flux of neutral carbon, resulting in excess free carbon in the deposited film. Increasing the pulse power density, and higher ionization efficiencies lead to greater C ionization; however, neutral C still dominates the flux of C species to the film. Ionized C is affected by the back-attraction effect, and neutral C might also be increasingly affected by scattering with Nb. Consequently, this results in the deposition of nearly stoichiometric films using the highest pulse power density and shortest pulse length.
Klasifikace
Druh
O - Ostatní výsledky
CEP obor
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OECD FORD obor
20506 - Coating and films
Návaznosti výsledku
Projekt
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Návaznosti
S - Specificky vyzkum na vysokych skolach
Ostatní
Rok uplatnění
2023
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů