SYNERGY EFFECT OF XRD, RAMAN, FTIR, UVVIS AND TEM ANALYSES IN mýc-Si:H AND nc-Si MICROSTRUCTURE DETERMINATION

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F14%3A43924243" target="_blank" >RIV/49777513:23640/14:43924243 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

SYNERGY EFFECT OF XRD, RAMAN, FTIR, UVVIS AND TEM ANALYSES IN mýc-Si:H AND nc-Si MICROSTRUCTURE DETERMINATION

Popis výsledku v původním jazyce

Tandem solar cells based on a-Si:H/mc-Si:H double- or triple-junction technology are very important for silicon thin film approach in order to enhance the efficiency of the cells especially convenient for the residential systems. Because for such systemsthe mc-Si:H and nc-Si materials have substantial importance, it is necessary to create them as good as possible. In order to obtain the required information about the structural and optical properties of the mc-Si:H and nc-Si films, X-ray diffraction, TEM, Raman and FTIR spectroscopies and UVVis spectrophotometry have to be used. In this study, a-Si:H, mc-Si:H films 300-350 nm in thickness and SiO2/a-Si:H multi-layers 600-650 nm in thickness were deposited by PECVD on Corning glass and crystalline silicon substrates to find out the influence of silane dilution with hydrogen in mc-Si:H films and a-Si:H sub-layer thickness in SiO2/a-Si multi-layered films on the micro-structural and optical properties of the films. The study was focused

Název v anglickém jazyce

SYNERGY EFFECT OF XRD, RAMAN, FTIR, UVVIS AND TEM ANALYSES IN mýc-Si:H AND nc-Si MICROSTRUCTURE DETERMINATION

Popis výsledku anglicky

Tandem solar cells based on a-Si:H/mc-Si:H double- or triple-junction technology are very important for silicon thin film approach in order to enhance the efficiency of the cells especially convenient for the residential systems. Because for such systemsthe mc-Si:H and nc-Si materials have substantial importance, it is necessary to create them as good as possible. In order to obtain the required information about the structural and optical properties of the mc-Si:H and nc-Si films, X-ray diffraction, TEM, Raman and FTIR spectroscopies and UVVis spectrophotometry have to be used. In this study, a-Si:H, mc-Si:H films 300-350 nm in thickness and SiO2/a-Si:H multi-layers 600-650 nm in thickness were deposited by PECVD on Corning glass and crystalline silicon substrates to find out the influence of silane dilution with hydrogen in mc-Si:H films and a-Si:H sub-layer thickness in SiO2/a-Si multi-layered films on the micro-structural and optical properties of the films. The study was focused

Druh

D - Stať ve sborníku

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

<a href="/cs/project/ED2.1.00%2F03.0088" target="_blank" >ED2.1.00/03.0088: Centrum nových technologií a materiálů (CENTEM)</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings ot the international Conference 29th European Photovoltaic Solar Energy Conference and Exhibition

ISBN

3-936338-34-5

ISSN

2196-0992

e-ISSN

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Počet stran výsledku

4

Strana od-do

1955-1958

Název nakladatele

WIP

Místo vydání

Mnichov

Místo konání akce

Amsterdam, Holandsko

Datum konání akce

22. 9. 2014

Typ akce podle státní příslušnosti

CST - Celostátní akce

Kód UT WoS článku

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