Effect of thermal annealing on sensing properties of optical fiber sensors coated with indium tin oxide nano-overlays
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60076658%3A12310%2F20%3A43901842" target="_blank" >RIV/60076658:12310/20:43901842 - isvavai.cz</a>
Výsledek na webu
<a href="http://www.photonics.pl/PLP/index.php/letters/article/view/12-20" target="_blank" >http://www.photonics.pl/PLP/index.php/letters/article/view/12-20</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.4302/plp.v12i2.1024" target="_blank" >10.4302/plp.v12i2.1024</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Effect of thermal annealing on sensing properties of optical fiber sensors coated with indium tin oxide nano-overlays
Popis výsledku v původním jazyce
In this work we discuss an effect of thermal annealing on optical and electrical properties of indium tin oxide (ITO) thin films deposited on a short section of the multimode polymer-clad silica (PCS) optical fiber core. ITO films were deposited using a different configuration of high-power impulse magnetron sputtering (HiPIMS) and radio frequency magnetron sputtering (RF MS) cathodes. Due to tuned ITO film thickness it was possible to observe for these structures a lossy-mode resonance (LMR) and trace changes in the properties of films. Electrical resistance of the ITO overlays was also measured. Both optical and electrical measurements were repeated after annealing at 200 degrees C in a tube furnace and nitrogen atmosphere. The measurements have shown that thermal annealing changes an optical response to the external refractive index (RI) of the fiber sensor and also changes the ITO layer resistivity. As an effect of thermal annealing, we observed a shift of the LMR towards longer wavelengths. In addition, as a result of annealing, the resistivity of the ITO layer was reduced.
Název v anglickém jazyce
Effect of thermal annealing on sensing properties of optical fiber sensors coated with indium tin oxide nano-overlays
Popis výsledku anglicky
In this work we discuss an effect of thermal annealing on optical and electrical properties of indium tin oxide (ITO) thin films deposited on a short section of the multimode polymer-clad silica (PCS) optical fiber core. ITO films were deposited using a different configuration of high-power impulse magnetron sputtering (HiPIMS) and radio frequency magnetron sputtering (RF MS) cathodes. Due to tuned ITO film thickness it was possible to observe for these structures a lossy-mode resonance (LMR) and trace changes in the properties of films. Electrical resistance of the ITO overlays was also measured. Both optical and electrical measurements were repeated after annealing at 200 degrees C in a tube furnace and nitrogen atmosphere. The measurements have shown that thermal annealing changes an optical response to the external refractive index (RI) of the fiber sensor and also changes the ITO layer resistivity. As an effect of thermal annealing, we observed a shift of the LMR towards longer wavelengths. In addition, as a result of annealing, the resistivity of the ITO layer was reduced.
Klasifikace
Druh
J<sub>SC</sub> - Článek v periodiku v databázi SCOPUS
CEP obor
—
OECD FORD obor
10306 - Optics (including laser optics and quantum optics)
Návaznosti výsledku
Projekt
—
Návaznosti
S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2020
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Photonics Letters of Poland
ISSN
2080-2242
e-ISSN
—
Svazek periodika
12
Číslo periodika v rámci svazku
2
Stát vydavatele periodika
PL - Polská republika
Počet stran výsledku
3
Strana od-do
58-60
Kód UT WoS článku
000546430300012
EID výsledku v databázi Scopus
2-s2.0-85087164883