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Security in defect detection: A new one-pixel attack for fooling DNNs

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60076658%3A12310%2F23%3A43907484" target="_blank" >RIV/60076658:12310/23:43907484 - isvavai.cz</a>

  • Výsledek na webu

    <a href="https://www.sciencedirect.com/science/article/pii/S1319157823002434?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S1319157823002434?via%3Dihub</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.jksuci.2023.101689" target="_blank" >10.1016/j.jksuci.2023.101689</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Security in defect detection: A new one-pixel attack for fooling DNNs

  • Popis výsledku v původním jazyce

    The Industrial 5.0 Model integrates enabling technologies such as deep learning, digital twins, and the meta-universe with new development concepts. However, model and data security may pose challenges for developing zero-defect production and other industrial manufacturing industries. To address this issue, we generate adversarial examples using a one-pixel attack in adversarial machine learning, which can fool the defect detection classification model. The traditional one-pixel attack based on the Differential Evolution (DE) algorithm has limited global search ability. Therefore, we use a novel algorithm called Teaching and Learning-based Moth-Flame Optimization (TLMFO), which enhances the global search performance and improves the attack effectiveness. We evaluate TLMFO on benchmark functions and attacks on Cifar10 and ImageNet datasets, and compare it with MFO and DE. The results show that TLMFO outperforms both MFO and DE in terms of accuracy and speed of convergence. Moreover, TLMFO achieves notably better attack effectiveness than DE under targeted and untargeted attacks on the Cifar10 dataset and under-targeted attacks on the ImageNet dataset. Our research confirms that safety prevention is a link worth considering in developing Industry 5.0.(c) 2023 The Author(s). Published by Elsevier B.V. on behalf of King Saud University. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).

  • Název v anglickém jazyce

    Security in defect detection: A new one-pixel attack for fooling DNNs

  • Popis výsledku anglicky

    The Industrial 5.0 Model integrates enabling technologies such as deep learning, digital twins, and the meta-universe with new development concepts. However, model and data security may pose challenges for developing zero-defect production and other industrial manufacturing industries. To address this issue, we generate adversarial examples using a one-pixel attack in adversarial machine learning, which can fool the defect detection classification model. The traditional one-pixel attack based on the Differential Evolution (DE) algorithm has limited global search ability. Therefore, we use a novel algorithm called Teaching and Learning-based Moth-Flame Optimization (TLMFO), which enhances the global search performance and improves the attack effectiveness. We evaluate TLMFO on benchmark functions and attacks on Cifar10 and ImageNet datasets, and compare it with MFO and DE. The results show that TLMFO outperforms both MFO and DE in terms of accuracy and speed of convergence. Moreover, TLMFO achieves notably better attack effectiveness than DE under targeted and untargeted attacks on the Cifar10 dataset and under-targeted attacks on the ImageNet dataset. Our research confirms that safety prevention is a link worth considering in developing Industry 5.0.(c) 2023 The Author(s). Published by Elsevier B.V. on behalf of King Saud University. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).

Klasifikace

  • Druh

    J<sub>imp</sub> - Článek v periodiku v databázi Web of Science

  • CEP obor

  • OECD FORD obor

    10201 - Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)

Návaznosti výsledku

  • Projekt

  • Návaznosti

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Ostatní

  • Rok uplatnění

    2023

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název periodika

    Journal of King Saud University-Computer and Information Sciences

  • ISSN

    1319-1578

  • e-ISSN

    2213-1248

  • Svazek periodika

    35

  • Číslo periodika v rámci svazku

    8

  • Stát vydavatele periodika

    NL - Nizozemsko

  • Počet stran výsledku

    16

  • Strana od-do

  • Kód UT WoS článku

    001080358700001

  • EID výsledku v databázi Scopus

    2-s2.0-85172465788