Evaluation of Electronic Components Degradation Using the Accelerated Reliability Testing Data
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG43__%2F20%3A00556839" target="_blank" >RIV/60162694:G43__/20:00556839 - isvavai.cz</a>
Výsledek na webu
<a href="https://www.rpsonline.com.sg/proceedings/esrel2020/pdf/4153.pdf" target="_blank" >https://www.rpsonline.com.sg/proceedings/esrel2020/pdf/4153.pdf</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.3850/978-981-14-8593-0_4153-cd" target="_blank" >10.3850/978-981-14-8593-0_4153-cd</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Evaluation of Electronic Components Degradation Using the Accelerated Reliability Testing Data
Popis výsledku v původním jazyce
The accelerated reliability testing is a useful tool to quickly obtain information about reliability of products. ART are widely used in the automotive and electrotechnical industries to estimate or verify the reliability parameters of component and system, to improve product reliability through detection of potential defects, to evaluate and compare products of different manufacturers. During the technical life, the majority of electronic component show degradation characteristics (degradation of individual technical parameters). This article describes the methodology how to evaluate reliability of electronic components in combat vehicles through degradation analysis of accelerated reliability testing data. In degradation analysis, basic mathematical models are used to extrapolate the performance measurements over time to the point where the product would have degraded beyond a limit value. When the degradation parameter exceeds a limit value, it can be considered a failure because test unit will be useless after those degradation levels. The paper demonstrate a practical application of the proposed method in the case of light emitting diodes, where process of degradation consists in degradation of light intensity.
Název v anglickém jazyce
Evaluation of Electronic Components Degradation Using the Accelerated Reliability Testing Data
Popis výsledku anglicky
The accelerated reliability testing is a useful tool to quickly obtain information about reliability of products. ART are widely used in the automotive and electrotechnical industries to estimate or verify the reliability parameters of component and system, to improve product reliability through detection of potential defects, to evaluate and compare products of different manufacturers. During the technical life, the majority of electronic component show degradation characteristics (degradation of individual technical parameters). This article describes the methodology how to evaluate reliability of electronic components in combat vehicles through degradation analysis of accelerated reliability testing data. In degradation analysis, basic mathematical models are used to extrapolate the performance measurements over time to the point where the product would have degraded beyond a limit value. When the degradation parameter exceeds a limit value, it can be considered a failure because test unit will be useless after those degradation levels. The paper demonstrate a practical application of the proposed method in the case of light emitting diodes, where process of degradation consists in degradation of light intensity.
Klasifikace
Druh
D - Stať ve sborníku
CEP obor
—
OECD FORD obor
20201 - Electrical and electronic engineering
Návaznosti výsledku
Projekt
—
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2020
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název statě ve sborníku
Proceedings of the 30th European Safety and Reliability Conference andthe 15th Probabilistic Safety Assessment and Management Conference
ISBN
978-981-14-8593-0
ISSN
—
e-ISSN
—
Počet stran výsledku
6
Strana od-do
1516-1521
Název nakladatele
Research Publishing
Místo vydání
Singapore
Místo konání akce
Venice, Italy
Datum konání akce
1. 11. 2020
Typ akce podle státní příslušnosti
WRD - Celosvětová akce
Kód UT WoS článku
—