An approach in determining the critical level of degradation based on results of accelerated test

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG43__%2F23%3A00557980" target="_blank" >RIV/60162694:G43__/23:00557980 - isvavai.cz</a>

Výsledek na webu

<a href="http://www.ein.org.pl/2022-02-14" target="_blank" >http://www.ein.org.pl/2022-02-14</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.17531/ein.2022.2.14" target="_blank" >10.17531/ein.2022.2.14</a>

Jazyk výsledku

angličtina

Název v původním jazyce

An approach in determining the critical level of degradation based on results of accelerated test

Popis výsledku v původním jazyce

Nowadays, systems are more complex and require high reliability for their components, especially critical system components. Therefore, to avoid serious damage, system are often replaced before the actual failure. The replaced parts are considered to have “soft failure”, and the limit in which the parts are replaced is known as the critical level of the degradation process. Determining the appropriate value of the critical level for a product is an important problem in their exploitation, as well as for predicting the Mean Time to Failure (MTTF) or Remaining Useful Lifetime (RUL) of this product based on the degradation data by the mathematical models. In this article, an approach in determining the critical levels based on failure data from an accelerated test is introduced. This approach is applied with the degradation process of Light-Emitting Diodes (LED) in an accelerated test and a type of Wiener process-based model is used to predict the MTTF or RUL of LED based on their degradation data and the found critical level.

Název v anglickém jazyce

An approach in determining the critical level of degradation based on results of accelerated test

Popis výsledku anglicky

Nowadays, systems are more complex and require high reliability for their components, especially critical system components. Therefore, to avoid serious damage, system are often replaced before the actual failure. The replaced parts are considered to have “soft failure”, and the limit in which the parts are replaced is known as the critical level of the degradation process. Determining the appropriate value of the critical level for a product is an important problem in their exploitation, as well as for predicting the Mean Time to Failure (MTTF) or Remaining Useful Lifetime (RUL) of this product based on the degradation data by the mathematical models. In this article, an approach in determining the critical levels based on failure data from an accelerated test is introduced. This approach is applied with the degradation process of Light-Emitting Diodes (LED) in an accelerated test and a type of Wiener process-based model is used to predict the MTTF or RUL of LED based on their degradation data and the found critical level.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

21100 - Other engineering and technologies

Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2022

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Eksploatacja i Niezawodnosc

ISSN

1507-2711

e-ISSN

1507-2711

Svazek periodika

24

Číslo periodika v rámci svazku

2

Stát vydavatele periodika

PL - Polská republika

Počet stran výsledku

8

Strana od-do

330-337

Kód UT WoS článku

000790011400002

EID výsledku v databázi Scopus

2-s2.0-85129220396