Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG43__%2F24%3A00558572" target="_blank" >RIV/60162694:G43__/24:00558572 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/62156489:43110/23:43922460

Výsledek na webu

<a href="https://reader.elsevier.com/reader/sd/pii/S026322412201418X?token=BFE43D5907D672C0ADB7C3DDBFD8E847EE3BDFFCC91088EAEA4A5AA788959F2F300269B27AFB8CEB6B64DC50ADF1E41B&originRegion=eu-west-1&originCreation=20221127094545" target="_blank" >https://reader.elsevier.com/reader/sd/pii/S026322412201418X?token=BFE43D5907D672C0ADB7C3DDBFD8E847EE3BDFFCC91088EAEA4A5AA788959F2F300269B27AFB8CEB6B64DC50ADF1E41B&originRegion=eu-west-1&originCreation=20221127094545</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.measurement.2022.112222" target="_blank" >10.1016/j.measurement.2022.112222</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process

Popis výsledku v původním jazyce

This article is devoted to estimating and demonstrating some LED reliability measures, such as the time during which the LED operation is failure-free and at the required luminance level. Our approach is based on multiply-accelerated reliability testing with very long experiment run supported by degradation modelling using a stochastic diffusion process. Multiple acceleration is provided by intensifying environmental climatic effects (heat exposure) and simultaneously increasing the stress of operating conditions (increased current load). The parameters for degradation models based on stochastic diffusion processes are estimated for the studied LEDs by a specific form of the maximum likelihood estimation (MLE) method, including parameter confidence intervals. Based on the results, the novel correlation between luminance level, luminous flux intensity and voltage magnitude is also determined. The aim is to estimate and demonstrate key LED reliability measures.

Název v anglickém jazyce

Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process

Popis výsledku anglicky

This article is devoted to estimating and demonstrating some LED reliability measures, such as the time during which the LED operation is failure-free and at the required luminance level. Our approach is based on multiply-accelerated reliability testing with very long experiment run supported by degradation modelling using a stochastic diffusion process. Multiple acceleration is provided by intensifying environmental climatic effects (heat exposure) and simultaneously increasing the stress of operating conditions (increased current load). The parameters for degradation models based on stochastic diffusion processes are estimated for the studied LEDs by a specific form of the maximum likelihood estimation (MLE) method, including parameter confidence intervals. Based on the results, the novel correlation between luminance level, luminous flux intensity and voltage magnitude is also determined. The aim is to estimate and demonstrate key LED reliability measures.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

21100 - Other engineering and technologies

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

MEASUREMENT

ISSN

0263-2241

e-ISSN

1873-412X

Svazek periodika

206

Číslo periodika v rámci svazku

January 2023

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

14

Strana od-do

112222

Kód UT WoS článku

000916885500008

EID výsledku v databázi Scopus

2-s2.0-85143509048