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Self-biased wavelength selective photodetection in an n-IGZO/p-GeSe heterostructure by polarity flipping

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F22%3A43924144" target="_blank" >RIV/60461373:22310/22:43924144 - isvavai.cz</a>

  • Výsledek na webu

    <a href="https://pubs.rsc.org/en/content/articlehtml/2022/nr/d2nr01013e" target="_blank" >https://pubs.rsc.org/en/content/articlehtml/2022/nr/d2nr01013e</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1039/d2nr01013e" target="_blank" >10.1039/d2nr01013e</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Self-biased wavelength selective photodetection in an n-IGZO/p-GeSe heterostructure by polarity flipping

  • Popis výsledku v původním jazyce

    Transparent semiconductor oxides with two-dimensional (2D) heterostructures have been extensively studied as new materials for thin-film transistors and photosensors due to their remarkable photovoltaic characteristics, making them useful for newly developed optoelectronics. Here we demonstrate the fabrication and characterization of an ITO/n-IGZO/p-GeSe transparent selective wavelength photodetector. The wavelength-dependent photovoltaic behavior of the n-IGZO/p-GeSe heterostructure under UV-Visible laser light shifts the I-V curves down with positive V-oc and negative I-sc values of about 0.12 V and -49 nA and 0.09 V and -17 nA, respectively. Interestingly, when an NIR laser irradiated the device, the I-V curves shifted up with negative V-oc and positive I-sc values of about -0.11 V and 45 nA, respectively. This behavior is attributed to the free carrier concentration induced by photogenerated carriers across the device at different points that varied with the wavelength-dependent photon absorption. Consequently, the direction of the electric field polarity across the junction can be flipped. This study demonstrates a zero-bias near-infrared (NIR) photodetector with a high photoresponsivity of 538.9 mA W-1, a fast rise time of 25.2 ms, and a decay time of 25.08 ms. Furthermore, we observed a detectivity (D) of 8.4 x 10(9) Jones, a normalized photocurrent to dark current ratio (NPDR) of 2.8 x 10(10) W-1, and a noise equivalent power (NEP) of 2.2 x 10(-14) W Hz(-1/2). Our strategy opens alternative possibilities for scalable, low-cost, multifunctional transparent near-infrared photosensors with selective wavelength photodetection.

  • Název v anglickém jazyce

    Self-biased wavelength selective photodetection in an n-IGZO/p-GeSe heterostructure by polarity flipping

  • Popis výsledku anglicky

    Transparent semiconductor oxides with two-dimensional (2D) heterostructures have been extensively studied as new materials for thin-film transistors and photosensors due to their remarkable photovoltaic characteristics, making them useful for newly developed optoelectronics. Here we demonstrate the fabrication and characterization of an ITO/n-IGZO/p-GeSe transparent selective wavelength photodetector. The wavelength-dependent photovoltaic behavior of the n-IGZO/p-GeSe heterostructure under UV-Visible laser light shifts the I-V curves down with positive V-oc and negative I-sc values of about 0.12 V and -49 nA and 0.09 V and -17 nA, respectively. Interestingly, when an NIR laser irradiated the device, the I-V curves shifted up with negative V-oc and positive I-sc values of about -0.11 V and 45 nA, respectively. This behavior is attributed to the free carrier concentration induced by photogenerated carriers across the device at different points that varied with the wavelength-dependent photon absorption. Consequently, the direction of the electric field polarity across the junction can be flipped. This study demonstrates a zero-bias near-infrared (NIR) photodetector with a high photoresponsivity of 538.9 mA W-1, a fast rise time of 25.2 ms, and a decay time of 25.08 ms. Furthermore, we observed a detectivity (D) of 8.4 x 10(9) Jones, a normalized photocurrent to dark current ratio (NPDR) of 2.8 x 10(10) W-1, and a noise equivalent power (NEP) of 2.2 x 10(-14) W Hz(-1/2). Our strategy opens alternative possibilities for scalable, low-cost, multifunctional transparent near-infrared photosensors with selective wavelength photodetection.

Klasifikace

  • Druh

    J<sub>imp</sub> - Článek v periodiku v databázi Web of Science

  • CEP obor

  • OECD FORD obor

    10402 - Inorganic and nuclear chemistry

Návaznosti výsledku

  • Projekt

  • Návaznosti

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Ostatní

  • Rok uplatnění

    2022

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název periodika

    Nanoscale

  • ISSN

    2040-3364

  • e-ISSN

    2040-3372

  • Svazek periodika

    14

  • Číslo periodika v rámci svazku

    30

  • Stát vydavatele periodika

    GB - Spojené království Velké Británie a Severního Irska

  • Počet stran výsledku

    8

  • Strana od-do

    10910-10917

  • Kód UT WoS článku

    000827064800001

  • EID výsledku v databázi Scopus

    2-s2.0-85135058151