Strain Modulation in van der Waals Crystals Directly Exfoliated onto Piezoceramics─Application in Micropiezoreflectance Spectroscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F24%3A43931485" target="_blank" >RIV/60461373:22310/24:43931485 - isvavai.cz</a>

Výsledek na webu

<a href="https://pubs.acs.org/doi/full/10.1021/acsaelm.4c01227" target="_blank" >https://pubs.acs.org/doi/full/10.1021/acsaelm.4c01227</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1021/acsaelm.4c01227" target="_blank" >10.1021/acsaelm.4c01227</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Strain Modulation in van der Waals Crystals Directly Exfoliated onto Piezoceramics─Application in Micropiezoreflectance Spectroscopy

Popis výsledku v původním jazyce

The van der Waals (vdW) crystals and heterostructures, known for many intriguing physical properties, have garnered significant interest in recent years. Developing effective optical methods to study their properties is still urgent for fundamental research as well as simple material characterization. Among these methods, modulation spectroscopy stands out, as it offers the advantage of easily obtaining information on direct optical transitions related to extended states while not being sensitive to defect-related states. In our work, we successfully applied piezoreflectance spectroscopy (strain modulation) to study vdW flakes and atomic-thick vdW layers with an approach that eliminates the need to attach these crystals to the piezoceramics with an adhesive. The strain variation in vdW flakes was achieved via direct exfoliation of crystal onto piezoceramic substrate and modulation of piezoceramic dimensions by an external voltage. The principle of operation of this approach is the electrostatic interaction between the vdW layer and the piezoceramic substrate, which in the nanoscale can be treated as a vdW interaction between the atoms of the vdW layer and the atoms of the piezoceramic substrate. This work provides an effective method to study direct optical transitions in exfoliated vdW layers and reveals the nature of the interaction between the vdW layer and the substrate. © 2024 The Authors. Published by American Chemical Society.

Název v anglickém jazyce

Strain Modulation in van der Waals Crystals Directly Exfoliated onto Piezoceramics─Application in Micropiezoreflectance Spectroscopy

Popis výsledku anglicky

The van der Waals (vdW) crystals and heterostructures, known for many intriguing physical properties, have garnered significant interest in recent years. Developing effective optical methods to study their properties is still urgent for fundamental research as well as simple material characterization. Among these methods, modulation spectroscopy stands out, as it offers the advantage of easily obtaining information on direct optical transitions related to extended states while not being sensitive to defect-related states. In our work, we successfully applied piezoreflectance spectroscopy (strain modulation) to study vdW flakes and atomic-thick vdW layers with an approach that eliminates the need to attach these crystals to the piezoceramics with an adhesive. The strain variation in vdW flakes was achieved via direct exfoliation of crystal onto piezoceramic substrate and modulation of piezoceramic dimensions by an external voltage. The principle of operation of this approach is the electrostatic interaction between the vdW layer and the piezoceramic substrate, which in the nanoscale can be treated as a vdW interaction between the atoms of the vdW layer and the atoms of the piezoceramic substrate. This work provides an effective method to study direct optical transitions in exfoliated vdW layers and reveals the nature of the interaction between the vdW layer and the substrate. © 2024 The Authors. Published by American Chemical Society.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10405 - Electrochemistry (dry cells, batteries, fuel cells, corrosion metals, electrolysis)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

ACS Applied Electronic Materials

ISSN

2637-6113

e-ISSN

2637-6113

Svazek periodika

6

Číslo periodika v rámci svazku

11

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

7857-7864

Kód UT WoS článku

001343726300001

EID výsledku v databázi Scopus

2-s2.0-85207720812