Comparison of resolution estimation methods in optical microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22340%2F18%3A43915674" target="_blank" >RIV/60461373:22340/18:43915674 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68407700:21230/18:00323518

Výsledek na webu

<a href="https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10752/107522Q/Comparison-of-resolution-estimation-methods-in-optical-microscopy/10.1117/12.2321301.short" target="_blank" >https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10752/107522Q/Comparison-of-resolution-estimation-methods-in-optical-microscopy/10.1117/12.2321301.short</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1117/12.2321301" target="_blank" >10.1117/12.2321301</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Comparison of resolution estimation methods in optical microscopy

Popis výsledku v původním jazyce

Super-resolution (SR) microscopy is a powerful technique which enhances the resolution of optical microscopes beyond the diffraction limit. Recent SR methods achieve the resolution of 100 nm. Theoretical resolution enhancement can be mathematically defined. However, the final resolution in the real image can be influenced by technical limitations. Evaluation of resolution in a real sample is essential to assess the performance of an SR technique. Several image based resolution limit evaluation methods exist, but the determination of cutoff frequency is still a challenging task. In order to compare the efficiency of assessing resolution methods, the reference estimation technique is necessary. There exist several conventional methods in digital image processing. In this paper, the most common resolution measurement techniques used in the optical microscopy imaging are presented and their performance compared. © COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.

Název v anglickém jazyce

Comparison of resolution estimation methods in optical microscopy

Popis výsledku anglicky

Super-resolution (SR) microscopy is a powerful technique which enhances the resolution of optical microscopes beyond the diffraction limit. Recent SR methods achieve the resolution of 100 nm. Theoretical resolution enhancement can be mathematically defined. However, the final resolution in the real image can be influenced by technical limitations. Evaluation of resolution in a real sample is essential to assess the performance of an SR technique. Several image based resolution limit evaluation methods exist, but the determination of cutoff frequency is still a challenging task. In order to compare the efficiency of assessing resolution methods, the reference estimation technique is necessary. There exist several conventional methods in digital image processing. In this paper, the most common resolution measurement techniques used in the optical microscopy imaging are presented and their performance compared. © COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

<a href="/cs/project/GA17-05840S" target="_blank" >GA17-05840S: Multikriteriální optimalizace modelů prostorově variantních zobrazovacích systémů</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2018

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of SPIE Volume 10752 Applications of Digital Image Processing XLI

ISBN

978-1-5106-2076-6

ISSN

0277-786X

e-ISSN

1996-756X

Počet stran výsledku

8

Strana od-do

"107522Q-1"-"107522Q-8"

Název nakladatele

SPIE Society of Photo-Optical Instrumentation Engineers

Místo vydání

Washington

Místo konání akce

San Diego

Datum konání akce

20. 8. 2018

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000450861700091